Kenichi Yamashita

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope and method for determining crystal ori...
- Patent number 10,935,505
- Issue date Mar 2, 2021
- Jeol Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Analysis Method
- Publication number 20190204245
- Publication date Jul 4, 2019
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
Portable information terminal and digital camera for portable infor...
- Publication number 20040041911
- Publication date Mar 4, 2004
- Kyocera Corporation
- Kenji Odagiri
- G06 - COMPUTING CALCULATING COUNTING