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Kenichi YOSHIDA
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Saitama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor component, assembly and method for manufacturing semi...
Patent number
11,300,593
Issue date
Apr 12, 2022
Shindengen Electric Manufacturing Co., Ltd.
Kenichi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and semiconductor component
Patent number
11,280,812
Issue date
Mar 22, 2022
Shindengen Electric Manufacturing Co., Ltd.
Kazuyuki Sashida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection substrate, assembly, and method for manufacturing detecti...
Patent number
11,268,988
Issue date
Mar 8, 2022
Shindengen Electric Manufacturing Co., Ltd.
Kazuyuki Sashida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR COMPONENT
Publication number
20210123953
Publication date
Apr 29, 2021
SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
Kazuyuki SASHIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR COMPONENT, ASSEMBLY AND METHOD FOR MANUFACTURING SEMI...
Publication number
20200386795
Publication date
Dec 10, 2020
SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
Kenichi SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
DETECTION SUBSTRATE, ASSEMBLY, AND METHOD FOR PRODUCING DETECTION S...
Publication number
20200371137
Publication date
Nov 26, 2020
SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
Kazuyuki SASHIDA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR COMPONENT, AND METHOD FOR MANUF...
Publication number
20200373379
Publication date
Nov 26, 2020
SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
Kazuyuki SASHIDA
H01 - BASIC ELECTRIC ELEMENTS