Kenichiro IKEMURA

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,013,349
- Issue date Jun 18, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,694,324
- Issue date Jul 4, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 10,816,402
- Issue date Oct 27, 2020
- Hamamatsu Photonics K.K.
- Kenichiro Ikemura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device, spectrum measuring method, and specimen...
- Patent number 10,209,189
- Issue date Feb 19, 2019
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 10,094,779
- Issue date Oct 9, 2018
- Hamamatsu Photonics K.K.
- Shigeru Eura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device and spectrum measuring method
- Patent number 9,423,339
- Issue date Aug 23, 2016
- Hamamatsu Photonics K.K.
- Shigeru Eura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DYE IMAGE ACQUISITION METHOD, DYE IMAGE ACQUISITION DEVICE, AND DYE...
- Publication number 20240344985
- Publication date Oct 17, 2024
- Hamamatsu Photonics K.K.
- Takafumi HIGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240302292
- Publication date Sep 12, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20240192139
- Publication date Jun 13, 2024
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20240183795
- Publication date Jun 6, 2024
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20240175825
- Publication date May 30, 2024
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE
- Publication number 20230324550
- Publication date Oct 12, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE DEVICE AND DISTANCE MEASUREMENT DEVICE
- Publication number 20230324520
- Publication date Oct 12, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230289950
- Publication date Sep 14, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220373480
- Publication date Nov 24, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220198644
- Publication date Jun 23, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20200096389
- Publication date Mar 26, 2020
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20170212047
- Publication date Jul 27, 2017
- Hamamatsu Photonics K.K.
- Shigeru EURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD
- Publication number 20150377770
- Publication date Dec 31, 2015
- Hamamatsu Photonics K.K.
- Shigeru EURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN...
- Publication number 20150346096
- Publication date Dec 3, 2015
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING

Kenichiro IKEMURA

Person

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Spectrometry device and spectrometry method

Spectrum measuring device, spectrum measuring method, and specimen...

Optical measurement device and optical measurement method

Spectrum measuring device and spectrum measuring method

Patents Applicationslast 30 patents

DYE IMAGE ACQUISITION METHOD, DYE IMAGE ACQUISITION DEVICE, AND DYE...

INSPECTION APPARATUS AND INSPECTION METHOD

MEASUREMENT DEVICE

MEASURING DEVICE

MEASURING DEVICE

DISTANCE MEASUREMENT DEVICE

LIGHT SOURCE DEVICE AND DISTANCE MEASUREMENT DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD

SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN...