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Kenji Fukuda
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Mito, JP
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last 30 patents
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Patent Grant
Method and apparatus for optically analyzing specimen by using two...
Patent number
4,176,957
Issue date
Dec 4, 1979
Hitachi, Ltd.
Yoshio Maeda
G01 - MEASURING TESTING
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Patent Grant
Spectrophotometer
Patent number
4,169,678
Issue date
Oct 2, 1979
Hitachi, Ltd.
Masaru Inoue
G01 - MEASURING TESTING
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Patent Grant
Monochromator combining a plurality of light dispersing elements
Patent number
4,102,576
Issue date
Jul 25, 1978
Hitachi, Ltd.
Yoshio Maeda
G01 - MEASURING TESTING