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Kenji GOMI
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor test instrument and the method to test semiconductor
Patent number
8,330,948
Issue date
Dec 11, 2012
Tokyo Denki University
Kenji Gomi
G01 - MEASURING TESTING
Information
Patent Grant
Birefringence measuring device and birefringence measuring method
Patent number
8,279,439
Issue date
Oct 2, 2012
Tokyo Denki University
Kenji Gomi
G01 - MEASURING TESTING
Information
Patent Grant
Stress measuring method and instrument
Patent number
7,639,348
Issue date
Dec 29, 2009
Tokyo Denki University
Yasushi Niitsu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BIREFRINGENCE MEASURING DEVICE AND BIREFRINGENCE MEASURING METHOD
Publication number
20110134429
Publication date
Jun 9, 2011
Kenji Gomi
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TEST INSTRUMENT AND THE METHOD TO TEST SEMICONDUCTOR
Publication number
20100271633
Publication date
Oct 28, 2010
Tokyo Denki University
Kenji GOMI
G01 - MEASURING TESTING
Information
Patent Application
Stress Measuring Method And Instrument
Publication number
20070273865
Publication date
Nov 29, 2007
Yasushi Niitsu
G01 - MEASURING TESTING