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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for measuring spectral radiation characteristics of fluoresc...
Patent number
11,428,631
Issue date
Aug 30, 2022
Konica Minolta, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Spectral characteristic measuring device, method for correcting spe...
Patent number
8,767,206
Issue date
Jul 1, 2014
Konica Minolta, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Spectral characteristic measuring system, spectral characteristic m...
Patent number
8,502,980
Issue date
Aug 6, 2013
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Illumination apparatus and reflective characteristics measuring app...
Patent number
8,345,230
Issue date
Jan 1, 2013
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring optical property of fluorescent...
Patent number
8,288,739
Issue date
Oct 16, 2012
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Optical property measurement apparatus
Patent number
8,243,261
Issue date
Aug 14, 2012
Konica Minolta Sensing, Inc.
Takeshi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Method of calibrating reflection characteristic measuring apparatus...
Patent number
8,130,371
Issue date
Mar 6, 2012
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Optical characteristic measuring apparatus
Patent number
8,115,924
Issue date
Feb 14, 2012
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving optical system, and spectrophotometer incorporated...
Patent number
8,064,133
Issue date
Nov 22, 2011
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Reflection characteristic measuring apparatus for sheet specimen an...
Patent number
7,973,935
Issue date
Jul 5, 2011
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Concave diffraction grating device, reflective dispersion device, a...
Patent number
7,916,292
Issue date
Mar 29, 2011
Konica Minolta Sensing, Inc.
Kenji Konno
G01 - MEASURING TESTING
Information
Patent Grant
Polychrometer and method for correcting stray lights of the same
Patent number
7,859,663
Issue date
Dec 28, 2010
Konica Minolta Sensing Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring optical property
Patent number
7,852,481
Issue date
Dec 14, 2010
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring reflection characteristics of object surfaces
Patent number
7,719,687
Issue date
May 18, 2010
Konica Minolta Sensing, Inc.
Jun Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Calibration reference light source and calibration system using the...
Patent number
7,710,559
Issue date
May 4, 2010
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength displacement correcting system
Patent number
7,705,983
Issue date
Apr 27, 2010
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Reflection characteristic measuring apparatus, and method for calib...
Patent number
7,697,136
Issue date
Apr 13, 2010
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Optical property measuring method and optical property measuring ap...
Patent number
7,675,620
Issue date
Mar 9, 2010
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel colorimeter and method for measuring spectral intensi...
Patent number
7,538,870
Issue date
May 26, 2009
Konica Minolta Sensing Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method and apparatus for measuring an optical property of...
Patent number
7,502,099
Issue date
Mar 10, 2009
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating spectral characteristics of a spectral analy...
Patent number
7,471,391
Issue date
Dec 30, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Reflection characteristic measuring apparatus
Patent number
7,436,516
Issue date
Oct 14, 2008
Konica Minolta Sensing, Inc.
Yoshihiro Okui
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring apparatus, illumination system, and light detecti...
Patent number
7,369,244
Issue date
May 6, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Light measuring apparatus and method for measuring monochromatic light
Patent number
7,369,239
Issue date
May 6, 2008
Konica Minolta Sensing, Inc.
Yoshiyuki Nagashima
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional spectroradiometer
Patent number
7,365,850
Issue date
Apr 29, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring goniometric reflection property of sample
Patent number
7,355,712
Issue date
Apr 8, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Calibration source for calibrating spectroradiometer, calibration m...
Patent number
7,339,665
Issue date
Mar 4, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Spectral sensitivity composing system
Patent number
7,327,458
Issue date
Feb 5, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Light measuring apparatus and a method for correcting non-linearity...
Patent number
7,286,215
Issue date
Oct 23, 2007
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Multi-angle colorimeter
Patent number
7,262,854
Issue date
Aug 28, 2007
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method For Measuring Spectral Radiation Characteristics Of Fluoresc...
Publication number
20210140884
Publication date
May 13, 2021
Konica Minolta, Inc.
Kenji IMURA
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPE...
Publication number
20130321802
Publication date
Dec 5, 2013
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Reflection characteristic measuring apparatus for sheet specimen, m...
Publication number
20110222065
Publication date
Sep 15, 2011
Konica Minolta Sensing, Inc.
Kenji IMURA
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC M...
Publication number
20110019192
Publication date
Jan 27, 2011
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
ILLUMINATION APPARATUS AND REFLECTIVE CHARACTERISTICS MEASURING APP...
Publication number
20100277728
Publication date
Nov 4, 2010
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Optical characteristic measuring apparatus
Publication number
20100103407
Publication date
Apr 29, 2010
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Optical property measurement apparatus
Publication number
20100091270
Publication date
Apr 15, 2010
KONICA MINOLTA SENSING, INC.
Takeshi Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring optical property of fluorescent...
Publication number
20090242803
Publication date
Oct 1, 2009
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Reflection characteristic measuring apparatus for sheet specimen, m...
Publication number
20090116026
Publication date
May 7, 2009
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Polychrometer and method for correcting stray lights of the same
Publication number
20090059224
Publication date
Mar 5, 2009
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Calibration reference light source and calibration system using the...
Publication number
20090051910
Publication date
Feb 26, 2009
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Light receiving optical system, and spectrophotometer incorporated...
Publication number
20090015916
Publication date
Jan 15, 2009
KONICA MINOLTA SENSING, INC.
Kenji Imura
G02 - OPTICS
Information
Patent Application
Reflection characteristic measuring apparatus, and method for calib...
Publication number
20080297791
Publication date
Dec 4, 2008
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for measuring optical property
Publication number
20080246969
Publication date
Oct 9, 2008
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
CONCAVE DIFFRACTION GRATING DEVICE, REFLECTIVE DISPERSION DEVICE, A...
Publication number
20080225291
Publication date
Sep 18, 2008
Konica Minolta Sensing, Inc.
Kenji KONNO
G02 - OPTICS
Information
Patent Application
WAVELENGTH DISPLACEMENT CORRECTING SYSTEM
Publication number
20080212092
Publication date
Sep 4, 2008
Konica Minolta Sensing, Inc.
Kenji IMURA
G01 - MEASURING TESTING
Information
Patent Application
Optical property measuring method and optical property measuring ap...
Publication number
20080137086
Publication date
Jun 12, 2008
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Reflection characteristic measuring apparatus
Publication number
20070273886
Publication date
Nov 29, 2007
KONICA MINOLTA SENSING, INC.
Jun Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
Reflection characteristic measuring apparatus
Publication number
20070195327
Publication date
Aug 23, 2007
KONICA MINOLTA SENSING, INC.
Yoshihiro Okui
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for measuring goniometric reflection property of sample
Publication number
20060290936
Publication date
Dec 28, 2006
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Method for calibrating spectral characteristics of a spectral analy...
Publication number
20060290929
Publication date
Dec 28, 2006
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Measuring method and apparatus for measuring an optical property of...
Publication number
20060227319
Publication date
Oct 12, 2006
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Light measuring apparatus and method for measuring monochromatic light
Publication number
20060146326
Publication date
Jul 6, 2006
KONICA MINOLTA SENSING, INC.
Yoshiyuki Nagashima
G01 - MEASURING TESTING
Information
Patent Application
Calibration source for calibrating spectroradiometer, calibration m...
Publication number
20060132760
Publication date
Jun 22, 2006
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Two-dimensional spectroradiometer
Publication number
20060132781
Publication date
Jun 22, 2006
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Optical measuring apparatus, illumination system, and light detecti...
Publication number
20060109474
Publication date
May 25, 2006
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Multi-channel colorimeter and method for measuring spectral intensi...
Publication number
20060001873
Publication date
Jan 5, 2006
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Multi-angle colorimeter
Publication number
20050286053
Publication date
Dec 29, 2005
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Spectral sensitivity composing system
Publication number
20050270526
Publication date
Dec 8, 2005
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Application
Light measuring apparatus and a method for correcting non-linearity...
Publication number
20050128475
Publication date
Jun 16, 2005
KONICA MINOLTA SENSING, INC.
Kenji Imura
G01 - MEASURING TESTING