Kenji Itasaka

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, method for fabricating the semiconductor devi...
- Patent number 6,573,121
- Issue date Jun 3, 2003
- Fujitsu Limited
- Yoshiyuki Yoneda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for testing semiconductor devices
- Patent number 6,392,433
- Issue date May 21, 2002
- Fujitsu Limited
- Kenji Itasaka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, method for fabricating the semiconductor devi...
- Patent number 6,376,921
- Issue date Apr 23, 2002
- Fujitsu Limited
- Yoshiyuki Yoneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for fabricating semiconductor device
- Patent number 6,159,770
- Issue date Dec 12, 2000
- Fujitsu Limited
- Masafumi Tetaka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device, method for fabricating the semiconductor devi...
- Publication number 20020027265
- Publication date Mar 7, 2002
- FUJITSU LIMITED
- Yoshiyuki Yoneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20010043076
- Publication date Nov 22, 2001
- KENJI ITASAKA
- G01 - MEASURING TESTING