Kenji Kawakami

Follow

Person

Ryuo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a semiconductor device including defect ins...
- Patent number 7,018,857
- Issue date Mar 28, 2006
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20050074910
- Publication date Apr 7, 2005
- Masatoshi Kanamaru
- G01 - MEASURING TESTING