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Kenji Kawakami
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Kai, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of manufacturing a semiconductor integrated circuit device a...
Patent number
8,206,997
Issue date
Jun 26, 2012
Renesas Electronics Corporation
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a semiconductor integrated circuit device a...
Patent number
8,062,911
Issue date
Nov 22, 2011
Renesas Electronics Corporation
Akio Hasebe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
THIN FILM PROBE SHEET AND SEMICONDUCTOR CHIP INSPECTION SYSTEM
Publication number
20110014727
Publication date
Jan 20, 2011
Akira Yabushita
G01 - MEASURING TESTING
Information
Patent Application
THIN-FILM PROBE SHEET AND METHOD OF MANUFACTURING THE SAME, PROBE C...
Publication number
20100301884
Publication date
Dec 2, 2010
Etsuko Takane
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE A...
Publication number
20100279502
Publication date
Nov 4, 2010
RENESAS TECHNOLOGY CORP.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE A...
Publication number
20080160657
Publication date
Jul 3, 2008
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
Thin film probe sheet and semiconductor chip inspection system
Publication number
20060094162
Publication date
May 4, 2006
Akira Yabushita
G01 - MEASURING TESTING
Information
Patent Application
Connecting apparatus, semiconductor chip inspecting apparatus, and...
Publication number
20060043593
Publication date
Mar 2, 2006
Terutaka Mori
G01 - MEASURING TESTING