Kenji MARUNO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Distance measuring device, distance measuring method, and three-dim...
- Patent number 11,644,545
- Issue date May 9, 2023
- Hitachi, Ltd.
- Kenji Maruno
- G02 - OPTICS
Information Patent Grant
Shape measuring system and shape measuring method
- Patent number 11,635,295
- Issue date Apr 25, 2023
- Hitachi, Ltd.
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
- Patent number 11,421,976
- Issue date Aug 23, 2022
- Hitachi, Ltd.
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
- Patent number 11,054,242
- Issue date Jul 6, 2021
- Hitachi, Ltd.
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device and three-dimensional shape measuring app...
- Patent number 10,900,773
- Issue date Jan 26, 2021
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
- Publication number 20230194247
- Publication date Jun 22, 2023
- Hitachi, Ltd
- Masahiro WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distance Measurement System and Distance Measurement Method
- Publication number 20220268929
- Publication date Aug 25, 2022
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Shape Measuring System and Shape Measuring Method
- Publication number 20220178680
- Publication date Jun 9, 2022
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
- Publication number 20210293524
- Publication date Sep 23, 2021
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
- Publication number 20200166327
- Publication date May 28, 2020
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Device and Three-Dimensional Shape Measuring App...
- Publication number 20200041259
- Publication date Feb 6, 2020
- Hitachi, Ltd
- Masahiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...
- Publication number 20200018823
- Publication date Jan 16, 2020
- Hitachi, Ltd
- Kenji MARUNO
- G01 - MEASURING TESTING

Kenji MARUNO

Person

Patents Grantslast 30 patents

Distance measuring device, distance measuring method, and three-dim...

Shape measuring system and shape measuring method

Shape measurement system, probe tip unit, and shape measurement method

Shape measurement system, probe tip unit, and shape measurement method

Distance measuring device and three-dimensional shape measuring app...

Patents Applicationslast 30 patents

SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD

Distance Measurement System and Distance Measurement Method

Shape Measuring System and Shape Measuring Method

SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD

SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD

Distance Measuring Device and Three-Dimensional Shape Measuring App...

DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...