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Kenji Matsui
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for inspecting printed circuit boards
Patent number
7,250,785
Issue date
Jul 31, 2007
Omron Corporation
Noboru Kawaike
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for inspecting printed circuit boards
Patent number
6,937,035
Issue date
Aug 30, 2005
Omron Corporation
Noboru Kawaike
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for inspecting printed circuit boards
Publication number
20050255744
Publication date
Nov 17, 2005
OMRON CORPORATION
Noboru Kawaike
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for inspecting printed circuit boards
Publication number
20030016026
Publication date
Jan 23, 2003
OMRON CORPORATION
Noboru Kawaike
G01 - MEASURING TESTING