Kenji NAKAHIRA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of improving quality of scanning charged particle microscope...
- Patent number 9,859,093
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope device and imaging method using same
- Patent number 9,824,853
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Mitsutoshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam device, specimen-image acquisition method, an...
- Patent number 9,741,530
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope device and image capturing method
- Patent number 9,460,889
- Issue date Oct 4, 2016
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasound diagnostic device and method of generating an intermedia...
- Patent number 9,408,591
- Issue date Aug 9, 2016
- Hitachi Medical Corporation
- Go Kotaki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical inspection apparatus and method thereof
- Patent number 9,360,434
- Issue date Jun 7, 2016
- Hitachi, Ltd.
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reviewing defect
- Patent number 9,342,879
- Issue date May 17, 2016
- Hitachi Hich-Technologies Corporation
- Yohei Minekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged-particle microscope device and method for inspecting sample...
- Patent number 9,341,584
- Issue date May 17, 2016
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Grant
Observation device and observation method
- Patent number 9,305,343
- Issue date Apr 5, 2016
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection method and optical inspection apparatus
- Patent number 9,267,898
- Issue date Feb 23, 2016
- Hitachi, Ltd.
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Grant
Medical diagnostic device and method of improving image quality of...
- Patent number 9,245,323
- Issue date Jan 26, 2016
- Hitachi Medical Corporation
- Jie Bai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and a method of improving image qualit...
- Patent number 9,019,362
- Issue date Apr 28, 2015
- Hitachi High-Technologies Corporation
- Jie Bai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect observation method and defect observation device
- Patent number 8,824,773
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method for producing image for inspection
- Patent number 8,730,318
- Issue date May 20, 2014
- Hitachi - GE Nuclear Energy, Ltd.
- Kenji Nakahira
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Ultrasonographic device and method for improving ultrasonographic d...
- Patent number 8,585,599
- Issue date Nov 19, 2013
- Hitachi Medical Corporation
- Kenji Nakahira
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning electron microscope and method for processing an image obt...
- Patent number 8,461,527
- Issue date Jun 11, 2013
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Grant
Scanning type charged particle beam microscope and an image process...
- Patent number 8,237,119
- Issue date Aug 7, 2012
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and method for processing an image obt...
- Patent number 8,106,357
- Issue date Jan 31, 2012
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for displaying detected defects
- Patent number 7,903,867
- Issue date Mar 8, 2011
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE DEVICE AND IMAGING METHOD USING SAME
- Publication number 20170169992
- Publication date Jun 15, 2017
- Hitachi High-Technologies Corporation
- Mitsutoshi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Improving Quality of Scanning Charged Particle Microscope...
- Publication number 20160343540
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Kenji NAKAHIRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...
- Publication number 20160336145
- Publication date Nov 17, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRASOUND DIAGNOSTIC DEVICE AND METHOD OF GENERATING AN INTERMEDIA...
- Publication number 20150272552
- Publication date Oct 1, 2015
- Hitachi Medical Corporation
- Go Kotaki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DATA HARMONIC ANALYSIS METHOD AND DATA ANALYSIS DEVICE
- Publication number 20150149475
- Publication date May 28, 2015
- Hitachi, Ltd
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Inspection Apparatus and Method Thereof
- Publication number 20150015893
- Publication date Jan 15, 2015
- Hitachi, Ltd
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
- Publication number 20140307946
- Publication date Oct 16, 2014
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Reviewing Defect
- Publication number 20140219546
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Apparatus and Method for Producing Image for Inspection
- Publication number 20140210988
- Publication date Jul 31, 2014
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Kenji NAKAHIRA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CHARGED PARTICLE MICROSCOPE DEVICE AND IMAGE CAPTURING METHOD
- Publication number 20140092231
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS
- Publication number 20130329227
- Publication date Dec 12, 2013
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE
- Publication number 20130140457
- Publication date Jun 6, 2013
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND IMAGE RECONSTRUCTION METHOD, DEVICE THEREFOR, AND ULTRAS...
- Publication number 20130090560
- Publication date Apr 11, 2013
- Go Kotaki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGE GENERATING METHOD AND DEVICE USING SCANNING CHARGED PARTICLE...
- Publication number 20130010100
- Publication date Jan 10, 2013
- Go Kotaki
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND A METHOD OF IMPROVING IMAGE QUALIT...
- Publication number 20120274757
- Publication date Nov 1, 2012
- Jie Bai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR PROCESSING AN IMAGE OBT...
- Publication number 20120126117
- Publication date May 24, 2012
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPE DEVICE AND METHOD FOR INSPECTING SAMPLE...
- Publication number 20120098952
- Publication date Apr 26, 2012
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Improving Image Quality of Ultrasonic Image, Ultrasonic...
- Publication number 20120041312
- Publication date Feb 16, 2012
- HITACHI MEDICAL CORPORATION
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Apparatus and Method for Producing Image for Inspection
- Publication number 20120026317
- Publication date Feb 2, 2012
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Kenji NAKAHIRA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCANNING TYPE CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR PRO...
- Publication number 20110187847
- Publication date Aug 4, 2011
- Jie Bai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDICAL DIAGNOSTIC DEVICE AND METHOD OF IMPROVING IMAGE QUALITY OF...
- Publication number 20110125030
- Publication date May 26, 2011
- Jie Bai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ULTRASONOGRAPHIC DEVICE AND METHOD FOR IMPROVING ULTRASONOGRAPHIC D...
- Publication number 20100280378
- Publication date Nov 4, 2010
- Kenji Nakahira
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Scanning Type Charged Particle Beam Microscope and an Image Process...
- Publication number 20090266985
- Publication date Oct 29, 2009
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR PROCESSING AN IMAGE OBT...
- Publication number 20080251719
- Publication date Oct 16, 2008
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DISPLAYING DETECTED DEFECTS
- Publication number 20070194231
- Publication date Aug 23, 2007
- Kenji Nakahira
- H01 - BASIC ELECTRIC ELEMENTS

Kenji NAKAHIRA

Person

Patents Grantslast 30 patents

Method of improving quality of scanning charged particle microscope...

Electron microscope device and imaging method using same

Charged-particle-beam device, specimen-image acquisition method, an...

Charged particle microscope device and image capturing method

Ultrasound diagnostic device and method of generating an intermedia...

Optical inspection apparatus and method thereof

Method and apparatus for reviewing defect

Charged-particle microscope device and method for inspecting sample...

Observation device and observation method

Optical inspection method and optical inspection apparatus

Medical diagnostic device and method of improving image quality of...

Charged particle beam device and a method of improving image qualit...

Defect observation method and defect observation device

Inspection apparatus and method for producing image for inspection

Ultrasonographic device and method for improving ultrasonographic d...

Scanning electron microscope and method for processing an image obt...

Scanning type charged particle beam microscope and an image process...

Scanning electron microscope and method for processing an image obt...

Method and apparatus for displaying detected defects

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE DEVICE AND IMAGING METHOD USING SAME

Method of Improving Quality of Scanning Charged Particle Microscope...

Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...

ULTRASOUND DIAGNOSTIC DEVICE AND METHOD OF GENERATING AN INTERMEDIA...

DATA HARMONIC ANALYSIS METHOD AND DATA ANALYSIS DEVICE

Optical Inspection Apparatus and Method Thereof

OBSERVATION DEVICE AND OBSERVATION METHOD

Method and Apparatus for Reviewing Defect

Inspection Apparatus and Method for Producing Image for Inspection

CHARGED PARTICLE MICROSCOPE DEVICE AND IMAGE CAPTURING METHOD

OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS

DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

ULTRASOUND IMAGE RECONSTRUCTION METHOD, DEVICE THEREFOR, AND ULTRAS...

IMAGE GENERATING METHOD AND DEVICE USING SCANNING CHARGED PARTICLE...

CHARGED PARTICLE BEAM DEVICE AND A METHOD OF IMPROVING IMAGE QUALIT...

SCANNING ELECTRON MICROSCOPE AND METHOD FOR PROCESSING AN IMAGE OBT...

CHARGED-PARTICLE MICROSCOPE DEVICE AND METHOD FOR INSPECTING SAMPLE...

Method for Improving Image Quality of Ultrasonic Image, Ultrasonic...

Inspection Apparatus and Method for Producing Image for Inspection

SCANNING TYPE CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR PRO...

MEDICAL DIAGNOSTIC DEVICE AND METHOD OF IMPROVING IMAGE QUALITY OF...

ULTRASONOGRAPHIC DEVICE AND METHOD FOR IMPROVING ULTRASONOGRAPHIC D...

Scanning Type Charged Particle Beam Microscope and an Image Process...

SCANNING ELECTRON MICROSCOPE AND METHOD FOR PROCESSING AN IMAGE OBT...

METHOD AND APPARATUS FOR DISPLAYING DETECTED DEFECTS