Kenji Nowara

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern position measuring device, method, and program, and record...
- Patent number 7,558,327
- Issue date Jul 7, 2009
- Advantest Corporation
- Kenji Nowara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for measuring CDMA signal
- Patent number 6,445,713
- Issue date Sep 3, 2002
- Advantest Corporation
- Kenji Nowara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Waveform quality measuring method and apparatus
- Patent number 5,974,087
- Issue date Oct 26, 1999
- Advantest Corporation
- Kenji Nowara
- G01 - MEASURING TESTING
Information Patent Grant
Parameter measuring apparatus for digital quadrature modulation sig...
- Patent number 5,946,359
- Issue date Aug 31, 1999
- Advantest Corporation
- Shinsuke Tajiri
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for measuring modulation parameters of digital quadrature-mo...
- Patent number 5,799,038
- Issue date Aug 25, 1998
- Advantest Corporation
- Kenji Nowara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Symbol point estimating apparatus, method, program, and recording m...
- Publication number 20070165751
- Publication date Jul 19, 2007
- Advantest Corporation
- Kenji Nowara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Pattern position measuring device, method, and program, and record...
- Publication number 20060039485
- Publication date Feb 23, 2006
- Kenji Nowara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE