Kenji Oka

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Verifying integrity of backup file in a multiple operating system e...
- Patent number 10,032,029
- Issue date Jul 24, 2018
- Lenovo (Singapore) Pte. Ltd.
- Seiichi Kawano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Operating environment switching between a primary and a secondary o...
- Patent number 9,910,677
- Issue date Mar 6, 2018
- Lenovo (Singapore) Pte. Ltd.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating system management of second operating system
- Patent number 9,753,739
- Issue date Sep 5, 2017
- Lenovo (Singapore) Pte. Ltd.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arrangement for secure independent operating environments in a comp...
- Patent number 9,483,278
- Issue date Nov 1, 2016
- Lenovo (Singapore) Pte. Ltd.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspecting apparatus and method for calibrating same
- Patent number 8,949,043
- Issue date Feb 3, 2015
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus and an inspecting method
- Patent number 8,831,899
- Issue date Sep 9, 2014
- Hitachi High-Technologies Corporation
- Kazunori Nemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,804,108
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Kenji Mitomo
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection apparatus
- Patent number 8,699,017
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,559,000
- Issue date Oct 15, 2013
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Associating biometric information with passwords
- Patent number 8,539,248
- Issue date Sep 17, 2013
- International Business Machines Corporation
- Mikio Hagiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection apparatus
- Patent number 8,462,327
- Issue date Jun 11, 2013
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,274,651
- Issue date Sep 25, 2012
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection apparatus
- Patent number 8,169,606
- Issue date May 1, 2012
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,107,717
- Issue date Jan 31, 2012
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,040,503
- Issue date Oct 18, 2011
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,916,929
- Issue date Mar 29, 2011
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection apparatus
- Patent number 7,773,210
- Issue date Aug 10, 2010
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 7,643,138
- Issue date Jan 5, 2010
- Hitachi, Ltd.
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection apparatus
- Patent number 7,557,911
- Issue date Jul 7, 2009
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,512,259
- Issue date Mar 31, 2009
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for observing and inspecting defects
- Patent number 7,499,162
- Issue date Mar 3, 2009
- Hitachi, Ltd.
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 7,460,220
- Issue date Dec 2, 2008
- Renesas Technology Corporation
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 7,417,723
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,274,813
- Issue date Sep 25, 2007
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for picking up 2D image of an object to be sensed
- Patent number 7,221,486
- Issue date May 22, 2007
- Hitachi, Ltd.
- Hiroshi Makihira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for switching between a combination of operating modes su...
- Patent number 7,181,634
- Issue date Feb 20, 2007
- Lenovo (Singapore) Pte. Ltd.
- Takayuki Katoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 7,180,584
- Issue date Feb 20, 2007
- Renesas Technology Corp.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling the switching of operating modes of an infor...
- Patent number 7,167,992
- Issue date Jan 23, 2007
- Lenovo Singapore Pte, Ltd
- Takayuki Katoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for observing and inspecting defects
- Patent number 7,092,095
- Issue date Aug 15, 2006
- Hitachi, Ltd.
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 7,061,600
- Issue date Jun 13, 2006
- Renesas Technology Corp.
- Shunji Maeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VERIFYING INTEGRITY OF BACKUP FILE IN A MULTIPLE OPERATING SYSTEM E...
- Publication number 20160012233
- Publication date Jan 14, 2016
- LENOVO (SINGAPORE) PTE, LTD.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATING ENVIRONMENT SWITCHING BETWEEN A PRIMARY AND A SECONDARY O...
- Publication number 20160004539
- Publication date Jan 7, 2016
- LENOVO (SINGAPORE) PTE, LTD.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARRANGEMENT FOR SECURE INDEPENDENT OPERATING ENVIRONMENTS IN A COMP...
- Publication number 20140337610
- Publication date Nov 13, 2014
- LENOVO (SINGAPORE) PTE, LTD.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATING SYSTEM MANAGEMENT OF SECOND OPERATING SYSTEM
- Publication number 20140317392
- Publication date Oct 23, 2014
- LENOVO (SINGAPORE) PTE, LTD.
- Seiichi Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Appearance Inspection Apparatus
- Publication number 20130242293
- Publication date Sep 19, 2013
- Hitachi High-Technologies Corporation
- Kenji OKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20120312104
- Publication date Dec 13, 2012
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Appearance Inspection Apparatus
- Publication number 20120194808
- Publication date Aug 2, 2012
- Hitachi High-Technologies Corporation
- Kenji OKA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20120128230
- Publication date May 24, 2012
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20120050729
- Publication date Mar 1, 2012
- Kenji Mitomo
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTING APPARATUS AND METHOD FOR CALIBRATING SAME
- Publication number 20120046884
- Publication date Feb 23, 2012
- Hitachi High-Technologies Corporation
- Kenji Oka
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20120006131
- Publication date Jan 12, 2012
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REFERENCE WAFER FOR CALIBRATION OF DARK-FIELD INSPECTION APPARATUS,...
- Publication number 20110276299
- Publication date Nov 10, 2011
- Kazunori Nemoto
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20110170765
- Publication date Jul 14, 2011
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Appearance Inspection Apparatus
- Publication number 20100259750
- Publication date Oct 14, 2010
- Hitachi High-Technologies Corporation
- Kenji OKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20100140474
- Publication date Jun 10, 2010
- Akira HAMAMATSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Appearance Inspection Apparatus
- Publication number 20090244529
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- Kenji OKA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20090214102
- Publication date Aug 27, 2009
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Observing and Inspecting Defects
- Publication number 20090141264
- Publication date Jun 4, 2009
- Hitachi, Ltd
- Yukihiro Shibata
- G02 - OPTICS
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20080291437
- Publication date Nov 27, 2008
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus and inspection method
- Publication number 20080239291
- Publication date Oct 2, 2008
- Hitachi High-Technologies Corporation
- Yasuhiro Miyanohara
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20080101685
- Publication date May 1, 2008
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Appearance Inspection Apparatus
- Publication number 20080024765
- Publication date Jan 31, 2008
- Hitachi High-Technologies Corporation
- Kenji OKA
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor substrate and method and appa...
- Publication number 20070070336
- Publication date Mar 29, 2007
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for observing and inspecting defects
- Publication number 20060238760
- Publication date Oct 26, 2006
- Hitachi, Ltd
- Yukihiro Shibata
- G02 - OPTICS
Information Patent Application
Method of inspecting a semiconductor device and an apparatus thereof
- Publication number 20060215153
- Publication date Sep 28, 2006
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Allowing or disallowing firmware upgrade based on comparison of fir...
- Publication number 20060136710
- Publication date Jun 22, 2006
- Kenji Oka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Associating biometric information with passwords
- Publication number 20060075256
- Publication date Apr 6, 2006
- Mikio Hagiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection method and apparatus
- Publication number 20060038987
- Publication date Feb 23, 2006
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting a semiconductor device and an apparatus thereof
- Publication number 20050196033
- Publication date Sep 8, 2005
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, service and program for variation reduction in an informati...
- Publication number 20050138449
- Publication date Jun 23, 2005
- International Business Machines Corporation
- Takayuki Katoh
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Verifying integrity of backup file in a multiple operating system e...

Operating environment switching between a primary and a secondary o...

Operating system management of second operating system

Arrangement for secure independent operating environments in a comp...

Surface inspecting apparatus and method for calibrating same

Inspecting apparatus and an inspecting method

Inspection method and inspection apparatus

Appearance inspection apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Associating biometric information with passwords

Appearance inspection apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Appearance inspection apparatus

Defect inspection method and apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Defect inspection method and apparatus

Appearance inspection apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Appearance inspection apparatus

Defect inspection method and apparatus

Method and apparatus for observing and inspecting defects

Manufacturing method of semiconductor substrate and method and appa...

Method of inspecting a semiconductor device and an apparatus thereof

Defect inspection method and apparatus

Method and apparatus for picking up 2D image of an object to be sensed

Apparatus for switching between a combination of operating modes su...

Manufacturing method of semiconductor substrate and method and appa...

Method for controlling the switching of operating modes of an infor...

Method and apparatus for observing and inspecting defects

Manufacturing method of semiconductor substrate and method and appa...

Patents Applicationslast 30 patents

VERIFYING INTEGRITY OF BACKUP FILE IN A MULTIPLE OPERATING SYSTEM E...

OPERATING ENVIRONMENT SWITCHING BETWEEN A PRIMARY AND A SECONDARY O...

ARRANGEMENT FOR SECURE INDEPENDENT OPERATING ENVIRONMENTS IN A COMP...

OPERATING SYSTEM MANAGEMENT OF SECOND OPERATING SYSTEM

Appearance Inspection Apparatus

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

Appearance Inspection Apparatus

DEFECT INSPECTION METHOD AND APPARATUS

INSPECTION METHOD AND INSPECTION APPARATUS

SURFACE INSPECTING APPARATUS AND METHOD FOR CALIBRATING SAME

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

REFERENCE WAFER FOR CALIBRATION OF DARK-FIELD INSPECTION APPARATUS,...

DEFECT INSPECTION METHOD AND APPARATUS

Appearance Inspection Apparatus

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

Appearance Inspection Apparatus

DEFECT INSPECTION METHOD AND APPARATUS

Method and Apparatus for Observing and Inspecting Defects

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

Inspection apparatus and inspection method

DEFECT INSPECTION METHOD AND APPARATUS

Appearance Inspection Apparatus

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for observing and inspecting defects

Method of inspecting a semiconductor device and an apparatus thereof

Allowing or disallowing firmware upgrade based on comparison of fir...

Associating biometric information with passwords

Defect inspection method and apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Method, service and program for variation reduction in an informati...