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Kenji Okabe
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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Telecentric optical apparatus
Patent number
11,467,384
Issue date
Oct 11, 2022
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Grant
Inclination adjusting mechanism
Patent number
10,908,380
Issue date
Feb 2, 2021
Mitutoyo Corporation
Hidekazu Sano
G02 - OPTICS
Information
Patent Grant
Telecentric optical apparatus
Patent number
10,520,710
Issue date
Dec 31, 2019
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Grant
Chromatic confocal sensor
Patent number
10,197,382
Issue date
Feb 5, 2019
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and method for switching set value for adjustment
Patent number
10,088,420
Issue date
Oct 2, 2018
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Variable focal length lens
Patent number
D829261
Issue date
Sep 25, 2018
Mitutoyo Corporation
Sadayuki Matsumiya
D16 - Photography and optical equipment
Information
Patent Grant
Light interference measuring device and program therefor
Patent number
9,726,473
Issue date
Aug 8, 2017
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device
Patent number
9,170,196
Issue date
Oct 27, 2015
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device
Patent number
9,006,657
Issue date
Apr 14, 2015
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Autofocus device including line image forming unit and rotation uni...
Patent number
8,772,688
Issue date
Jul 8, 2014
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Grant
Microscope
Patent number
D706847
Issue date
Jun 10, 2014
Mitutoyo Corporation
Sadayuki Matsumiya
D16 - Photography and optical equipment
Information
Patent Grant
Autofocus device with contrast enhancement
Patent number
8,258,448
Issue date
Sep 4, 2012
Mitutoyo Corporation
Tatsuya Nagahama
G02 - OPTICS
Information
Patent Grant
Test management method for indentation tester and indentation tester
Patent number
8,087,282
Issue date
Jan 3, 2012
Mitutoyo Corporation
Takeshi Sawa
G01 - MEASURING TESTING
Information
Patent Grant
Laser processing apparatus
Patent number
8,071,910
Issue date
Dec 6, 2011
Mitutoyo Corporation
Kenji Okabe
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Objective lens and optical measuring device
Patent number
7,855,844
Issue date
Dec 21, 2010
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Grant
Optical measuring machine
Patent number
7,528,968
Issue date
May 5, 2009
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Illuminating apparatus for image processing type measuring machines
Patent number
6,755,562
Issue date
Jun 29, 2004
Mitutoyo Corporation
Shunsaku Tachibana
G02 - OPTICS
Information
Patent Grant
Telecentric lens system and image measuring device
Patent number
6,707,617
Issue date
Mar 16, 2004
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Grant
Two beam interference objective device
Patent number
6,657,728
Issue date
Dec 2, 2003
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Imaging probe
Patent number
6,621,065
Issue date
Sep 16, 2003
Mitutoyo Corporation
Yasushi Fukumoto
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Focus detection unit and optical measuring instrument having the same
Patent number
6,407,800
Issue date
Jun 18, 2002
Mitutoyo Corporation
Seiji Shimokawa
G02 - OPTICS
Information
Patent Grant
Projection measuring instrument
Patent number
6,147,758
Issue date
Nov 14, 2000
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Auto-focus device
Patent number
6,075,558
Issue date
Jun 13, 2000
Mitutoyo Corporation
Shunsaku Tachibana
G02 - OPTICS
Information
Patent Grant
Optical gauge with adjustable light path bending mirror
Patent number
5,856,874
Issue date
Jan 5, 1999
Mitutoyo Corporation
Shunsaku Tachibana
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TELECENTRIC OPTICAL APPARATUS
Publication number
20200073093
Publication date
Mar 5, 2020
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Application
INCLINATION ADJUSTING MECHANISM
Publication number
20190146176
Publication date
May 16, 2019
Mitutoyo Corporation
Hidekazu Sano
G02 - OPTICS
Information
Patent Application
CHROMATIC CONFOCAL SENSOR
Publication number
20180112966
Publication date
Apr 26, 2018
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD FOR SWITCHING SET VALUE FOR ADJUSTMENT
Publication number
20170336327
Publication date
Nov 23, 2017
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Application
TELECENTRIC OPTICAL APPARATUS
Publication number
20160349490
Publication date
Dec 1, 2016
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Application
LIGHT INTERFERENCE MEASURING DEVICE AND PROGRAM THEREFOR
Publication number
20150176967
Publication date
Jun 25, 2015
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE
Publication number
20140145084
Publication date
May 29, 2014
Mitutoyo Corporation
Kenji OKABE
G02 - OPTICS
Information
Patent Application
AUTOFOCUS DEVICE
Publication number
20120193511
Publication date
Aug 2, 2012
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Application
OPTICAL MEASURING DEVICE
Publication number
20120153152
Publication date
Jun 21, 2012
Mitutoyo Corporation
Kenji OKABE
G02 - OPTICS
Information
Patent Application
AUTOFOCUS DEVICE
Publication number
20100133417
Publication date
Jun 3, 2010
Mitutoyo Corporation
Tatsuya Nagahama
G02 - OPTICS
Information
Patent Application
Laser processing apparatus
Publication number
20090283506
Publication date
Nov 19, 2009
Mitutoyo Corporation
Kenji Okabe
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Test management method for indentation tester and indentation tester
Publication number
20090044609
Publication date
Feb 19, 2009
Mitutoyo Corporation
Takeshi Sawa
G01 - MEASURING TESTING
Information
Patent Application
Objective lens and optical measuring device
Publication number
20080285158
Publication date
Nov 20, 2008
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS
Information
Patent Application
Optical measuring machine
Publication number
20080252904
Publication date
Oct 16, 2008
Mitutoyo Corporation
Sadayuki Matsumiya
G02 - OPTICS
Information
Patent Application
Illuminating apparatus for image processing type measuring machines
Publication number
20030169601
Publication date
Sep 11, 2003
Mitutoyo Corporation
Shunsaku Tachibana
G02 - OPTICS
Information
Patent Application
Telecentric lens system and image measuring device
Publication number
20030151823
Publication date
Aug 14, 2003
Mitutoyo Corporation
Kenji Okabe
G02 - OPTICS