Kenji Saitoh

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
- Patent number 9,389,067
- Issue date Jul 12, 2016
- Canon Kabushiki Kaisha
- Tetsuri Sonoda
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and method for measuring surface shape and ro...
- Patent number 8,497,995
- Issue date Jul 30, 2013
- Canon Kabushiki Kaisha
- Kazuyuki Ota
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement processing method
- Patent number 8,456,621
- Issue date Jun 4, 2013
- Canon Kabushiki Kaisha
- Kazuyuki Ota
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus and method
- Patent number 8,437,003
- Issue date May 7, 2013
- Canon Kabushiki Kaisha
- Hiroshi Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement processing method
- Patent number 8,274,646
- Issue date Sep 25, 2012
- Canon Kabushiki Kaisha
- Kazuyuki Ota
- G01 - MEASURING TESTING
Information Patent Grant
Corner cube member illumination device and inspection system having...
- Patent number 7,988,309
- Issue date Aug 2, 2011
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G01 - MEASURING TESTING
Information Patent Grant
Illuminating apparatus and surface inspection system using illumina...
- Patent number 7,965,917
- Issue date Jun 21, 2011
- Canon Kabushiki Kaisha
- Hiroshi Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Illumination apparatus and appearance inspection apparatus includin...
- Patent number 7,957,636
- Issue date Jun 7, 2011
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method
- Patent number 7,924,418
- Issue date Apr 12, 2011
- Canon Kabushiki Kaisha
- Hiroshi Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Illuminating apparatus and image sensing system including illuminat...
- Patent number 7,901,098
- Issue date Mar 8, 2011
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G02 - OPTICS
Information Patent Grant
Image pickup optical system
- Patent number 7,605,860
- Issue date Oct 20, 2009
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G02 - OPTICS
Information Patent Grant
Wireless imaging apparatus and its control method
- Patent number 7,508,417
- Issue date Mar 24, 2009
- Canon Kabushiki Kaisha
- Naoki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Exposure method and apparatus
- Patent number 7,402,378
- Issue date Jul 22, 2008
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask and manufacturing method thereof and exposure method
- Patent number 7,399,558
- Issue date Jul 15, 2008
- Canon Kabushiki Kaisha
- Kenji Yamazoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Image processing system, method and program for image sensing using...
- Patent number 7,277,125
- Issue date Oct 2, 2007
- Canon Kabushki Kaisha
- Naoki Nishimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Exposure method and apparatus
- Patent number 7,217,503
- Issue date May 15, 2007
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask and its manufacturing method, exposure, and device fabrication...
- Patent number 7,214,453
- Issue date May 8, 2007
- Canon Kabushiki Kaisha
- Kenji Yamazoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for setting mask pattern and illumination condition
- Patent number 7,107,573
- Issue date Sep 12, 2006
- Canon Kabushiki Kaisha
- Kenji Yamazoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wireless communication apparatus and method
- Patent number 7,075,455
- Issue date Jul 11, 2006
- Canon Kabushiki Kaisha
- Naoki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Exposure method and apparatus
- Patent number 6,991,877
- Issue date Jan 31, 2006
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometer and interferance measurement method
- Patent number 6,842,255
- Issue date Jan 11, 2005
- Canon Kabushiki Kaisha
- Yumiko Ohsaki
- G01 - MEASURING TESTING
Information Patent Grant
Mask manufacturing method
- Patent number 6,839,890
- Issue date Jan 4, 2005
- Canon Kabushiki Kaisha
- Mitsuro Sugita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical system and optical instrument with diffractive optical element
- Patent number 6,829,091
- Issue date Dec 7, 2004
- Canon Kabushiki Kaisha
- Takashi Kato
- G02 - OPTICS
Information Patent Grant
Exposure method and device manufacturing method using the same
- Patent number 6,828,085
- Issue date Dec 7, 2004
- Canon Kabushiki Kaisha
- Tetsunobu Kochi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multiple exposure method
- Patent number 6,544,721
- Issue date Apr 8, 2003
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multiple exposure device formation
- Patent number 6,534,242
- Issue date Mar 18, 2003
- Canon Kabushiki Kaisha
- Mitsuro Sugita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multiple exposure method
- Patent number 6,403,291
- Issue date Jun 11, 2002
- Canon Kabushiki Kaisha
- Miyoko Kawashima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device manufacturing method and apparatus utilizing concentric fan-...
- Patent number 6,221,541
- Issue date Apr 24, 2001
- Canon Kabushiki Kaisha
- Makoto Ogusu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position detecting apparatus
- Patent number 6,157,452
- Issue date Dec 5, 2000
- Canon Kabushiki Kaisha
- Masanobu Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position detecting system and device manufacturing method using the...
- Patent number 6,154,281
- Issue date Nov 28, 2000
- Canon Kabushiki Kaisha
- Koichi Sentoku
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...
- Publication number 20140063192
- Publication date Mar 6, 2014
- Tetsuri Sonoda
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD
- Publication number 20120327400
- Publication date Dec 27, 2012
- Canon Kabushiki Kaisha
- Kazuyuki Ota
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND METHOD
- Publication number 20110037984
- Publication date Feb 17, 2011
- Canon Kabushiki Kaisha
- Hiroshi Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD
- Publication number 20100328649
- Publication date Dec 30, 2010
- Canon Kabushiki Kaisha
- Kazuyuki Ota
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND METHOD FOR MEASURING SURFACE SHAPE AND RO...
- Publication number 20100220338
- Publication date Sep 2, 2010
- Canon Kabushiki Kaisha
- Kazuyuki Ota
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION APPARATUS AND APPEARANCE INSPECTION APPARATUS INCLUDIN...
- Publication number 20100111515
- Publication date May 6, 2010
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G02 - OPTICS
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20090015823
- Publication date Jan 15, 2009
- Canon Kabushiki Kaisha
- Hiroshi Yoshikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ILLUMINATION DEVICE AND INSPECTION SYSTEM HAVING SAME
- Publication number 20080080161
- Publication date Apr 3, 2008
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATING APPARATUS AND IMAGE SENSING SYSTEM INCLUDING ILLUMINAT...
- Publication number 20070292088
- Publication date Dec 20, 2007
- Canon Kabushiki Kaisha
- Kenji Saitoh
- G02 - OPTICS
Information Patent Application
ILLUMINATING APPARATUS AND SURFACE INSPECTION SYSTEM USING ILLUMINA...
- Publication number 20070292100
- Publication date Dec 20, 2007
- Canon Kabushiki Kaisha
- Hiroshi Yoshikawa
- G02 - OPTICS
Information Patent Application
IMAGE PICKUP OPTICAL SYSTEM
- Publication number 20070273782
- Publication date Nov 29, 2007
- Kenji Saitoh
- G02 - OPTICS
Information Patent Application
Exposure method and apparatus
- Publication number 20060033900
- Publication date Feb 16, 2006
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask and manufacturing method thereof and exposure method
- Publication number 20050037267
- Publication date Feb 17, 2005
- Kenji Yamazoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Image processing system, method and program
- Publication number 20040165076
- Publication date Aug 26, 2004
- Naoki Nishimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask and its manufacturing method, exposure, and device fabrication...
- Publication number 20040166422
- Publication date Aug 26, 2004
- Kenji Yamazoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Wireless imaging apparatus and its control method
- Publication number 20040071460
- Publication date Apr 15, 2004
- Naoki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Wireless communication apparatus and method
- Publication number 20040005889
- Publication date Jan 8, 2004
- Naoki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Mask manufacturing method
- Publication number 20030233629
- Publication date Dec 18, 2003
- Mitsuro Sugita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for setting mask pattern and illumination condition
- Publication number 20030198872
- Publication date Oct 23, 2003
- Kenji Yamazoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL SYSTEM AND OPTICAL INSTRUMENT WITH DIFFRACTIVE OPTICAL ELEMENT
- Publication number 20030016447
- Publication date Jan 23, 2003
- TAKASHI KATO
- G02 - OPTICS
Information Patent Application
EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD USING THE SAME
- Publication number 20020187440
- Publication date Dec 12, 2002
- TETSUNOBU KOCHI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Interferometer and interferance measurement method
- Publication number 20020176090
- Publication date Nov 28, 2002
- Yumiko Ohsaki
- G01 - MEASURING TESTING
Information Patent Application
Exposure method and apparatus
- Publication number 20020177054
- Publication date Nov 28, 2002
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Exposure method and apparatus
- Publication number 20020177048
- Publication date Nov 28, 2002
- Kenji Saitoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Exposure method, exposure apparatus, and device manufacturing method
- Publication number 20020031725
- Publication date Mar 14, 2002
- Mitsuro Sugita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Kenji Saitoh

Person

Patents Grantslast 30 patents

Three-dimensional shape measuring apparatus, three-dimensional shap...

Measurement apparatus and method for measuring surface shape and ro...

Measurement system and measurement processing method

Information processing apparatus and method

Measurement system and measurement processing method

Corner cube member illumination device and inspection system having...

Illuminating apparatus and surface inspection system using illumina...

Illumination apparatus and appearance inspection apparatus includin...

Inspection apparatus and method

Illuminating apparatus and image sensing system including illuminat...

Image pickup optical system

Wireless imaging apparatus and its control method

Exposure method and apparatus

Mask and manufacturing method thereof and exposure method

Image processing system, method and program for image sensing using...

Exposure method and apparatus

Mask and its manufacturing method, exposure, and device fabrication...

Method for setting mask pattern and illumination condition

Wireless communication apparatus and method

Exposure method and apparatus

Interferometer and interferance measurement method

Mask manufacturing method

Optical system and optical instrument with diffractive optical element

Exposure method and device manufacturing method using the same

Multiple exposure method

Multiple exposure device formation

Multiple exposure method

Device manufacturing method and apparatus utilizing concentric fan-...

Position detecting apparatus

Position detecting system and device manufacturing method using the...

Patents Applicationslast 30 patents

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...

MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD

INFORMATION PROCESSING APPARATUS AND METHOD

MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD

MEASUREMENT APPARATUS AND METHOD FOR MEASURING SURFACE SHAPE AND RO...

ILLUMINATION APPARATUS AND APPEARANCE INSPECTION APPARATUS INCLUDIN...

INSPECTION APPARATUS AND METHOD

ILLUMINATION DEVICE AND INSPECTION SYSTEM HAVING SAME

ILLUMINATING APPARATUS AND IMAGE SENSING SYSTEM INCLUDING ILLUMINAT...

ILLUMINATING APPARATUS AND SURFACE INSPECTION SYSTEM USING ILLUMINA...

IMAGE PICKUP OPTICAL SYSTEM

Exposure method and apparatus

Mask and manufacturing method thereof and exposure method

Image processing system, method and program

Mask and its manufacturing method, exposure, and device fabrication...

Wireless imaging apparatus and its control method

Wireless communication apparatus and method

Mask manufacturing method

Method for setting mask pattern and illumination condition

OPTICAL SYSTEM AND OPTICAL INSTRUMENT WITH DIFFRACTIVE OPTICAL ELEMENT

EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD USING THE SAME

Interferometer and interferance measurement method

Exposure method and apparatus

Exposure method and apparatus

Exposure method, exposure apparatus, and device manufacturing method