Kenji SASAKI

Follow

Person

Aomori, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Control server and control system for controlling traffic signals b...
- Patent number 10,249,187
- Issue date Apr 2, 2019
- Kabushiki Kaisha Nihon Micronics
- Hiroshi Kamiya
- G08 - SIGNALLING
Information Patent Grant
Electric connecting apparatus
- Patent number 9,400,309
- Issue date Jul 26, 2016
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, probe card including the same, and methods for manu...
- Patent number 9,121,869
- Issue date Sep 1, 2015
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrical connecting apparatus and contacts used therefor
- Patent number 8,366,477
- Issue date Feb 5, 2013
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus and method for manufacturing the same
- Patent number 7,819,668
- Issue date Oct 26, 2010
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTROL SERVER AND CONTROL SYSTEM
- Publication number 20180122233
- Publication date May 3, 2018
- Kabushiki Kaisha Nihon Micronics
- Hiroshi KAMIYA
- G08 - SIGNALLING
Information Patent Application
ELECTRIC CONNECTING APPARATUS
- Publication number 20150008945
- Publication date Jan 8, 2015
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY, PROBE CARD INCLUDING THE SAME, AND METHODS FOR MANU...
- Publication number 20130154682
- Publication date Jun 20, 2013
- Kabushiki Kaisha Nihon Micronics
- Satoshi NARITA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS AND CONTACTS USED THEREFOR
- Publication number 20120003864
- Publication date Jan 5, 2012
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND METHOD FOR MANUFACTURING THE SAME, AN...
- Publication number 20110175635
- Publication date Jul 21, 2011
- Kabushiki Kaisha Nihon Micronics
- Daigo NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080143362
- Publication date Jun 19, 2008
- Kabushiki Kaisha Nihon Micronics
- Satoshi NARITA
- G01 - MEASURING TESTING