Kenji Shimazaki

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, method of generating pattern for semiconducto...
- Patent number 7,911,027
- Issue date Mar 22, 2011
- Panasonic Corporation
- Mitsumi Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operation analysis method of semiconductor integrated circuit
- Patent number 7,779,376
- Issue date Aug 17, 2010
- Panasonic Corporation
- Shingo Miyahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing a semiconductor integrated circuit
- Patent number 7,480,875
- Issue date Jan 20, 2009
- Panasonic Corporation
- Kazuhiro Satoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device method of generating semiconductor device patt...
- Patent number 7,307,333
- Issue date Dec 11, 2007
- Matsushita Electric Industrial Co., Ltd.
- Mitsumi Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design method for semiconductor integrated circuit suppressing powe...
- Patent number 7,278,124
- Issue date Oct 2, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operation analyzing method for semiconductor integrated circuit dev...
- Patent number 7,225,418
- Issue date May 29, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for estimating EMI in a semiconductor device
- Patent number 7,120,551
- Issue date Oct 10, 2006
- Matsushita Electric Industrial Co., Ltd.
- Shozo Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analyzing electromagnetic interference
- Patent number 7,039,572
- Issue date May 2, 2006
- Matsushita Electric Industrial Co., Ltd.
- Hidetoshi Narahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analyzing electromagnetic interference
- Patent number 6,959,250
- Issue date Oct 25, 2005
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for analyzing electromagnetic interference
- Patent number 6,876,210
- Issue date Apr 5, 2005
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electromagnetic disturbance analysis method and apparatus and semic...
- Patent number 6,810,340
- Issue date Oct 26, 2004
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for optimizing electromagnetic interference and method for a...
- Patent number 6,782,347
- Issue date Aug 24, 2004
- Matsushita Electric Industrial Co., Ltd.
- Shouzou Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electromagnetic interference analysis method and apparatus
- Patent number 6,754,598
- Issue date Jun 22, 2004
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G01 - MEASURING TESTING
Information Patent Grant
Means of calculating power consumption characteristic and method th...
- Patent number 6,321,168
- Issue date Nov 20, 2001
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Operation analysis method of semiconductor integrated circuit
- Publication number 20080092090
- Publication date Apr 17, 2008
- Shingo Miyahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device, method of generating pattern for semiconducto...
- Publication number 20070187777
- Publication date Aug 16, 2007
- Matsushita Electric Industrial Co., Ltd.
- Mitsumi Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of designing a semiconductor integrated circuit
- Publication number 20060143585
- Publication date Jun 29, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kazuhiro Satoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of analyzing operation of semiconductor integrated circuit d...
- Publication number 20060091550
- Publication date May 4, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Resistance value calculation method
- Publication number 20050177334
- Publication date Aug 11, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Shozo Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design method for semiconductor integrated circuit suppressing powe...
- Publication number 20050149894
- Publication date Jul 7, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for analyzing power supply noise of semiconductor integrated...
- Publication number 20050114054
- Publication date May 26, 2005
- Kenji Shimazaki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device method of generating semiconductor device patt...
- Publication number 20050017320
- Publication date Jan 27, 2005
- Mitsumi Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Substrate noise analyzing method for semiconductor integrated circu...
- Publication number 20050005254
- Publication date Jan 6, 2005
- Matsushita Electric Industrial Co. Ltd.
- Shouzou Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Operation analyzing method for semiconductor integrated circuit dev...
- Publication number 20040249588
- Publication date Dec 9, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electromagnetic interference analysis method and apparatus
- Publication number 20030057966
- Publication date Mar 27, 2003
- Kenji Shimazaki
- G01 - MEASURING TESTING
Information Patent Application
Electromagnetic disturbance analysis method and apparatus and semic...
- Publication number 20020147553
- Publication date Oct 10, 2002
- Kenji Shimazaki
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing electromagnetic interference
- Publication number 20020075018
- Publication date Jun 20, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kenji Shimazaki
- G01 - MEASURING TESTING
Information Patent Application
Method for optimizing electromagnetic interference and method for a...
- Publication number 20020065643
- Publication date May 30, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Shouzou Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electromagnetic interference analysis method and apparatus
- Publication number 20020045995
- Publication date Apr 18, 2002
- Kenji Shimazaki
- G01 - MEASURING TESTING

Kenji Shimazaki

Person

Patents Grantslast 30 patents

Semiconductor device, method of generating pattern for semiconducto...

Operation analysis method of semiconductor integrated circuit

Method of designing a semiconductor integrated circuit

Semiconductor device method of generating semiconductor device patt...

Design method for semiconductor integrated circuit suppressing powe...

Operation analyzing method for semiconductor integrated circuit dev...

Method for estimating EMI in a semiconductor device

Method of analyzing electromagnetic interference

Method of analyzing electromagnetic interference

Method and apparatus for analyzing electromagnetic interference

Electromagnetic disturbance analysis method and apparatus and semic...

Method for optimizing electromagnetic interference and method for a...

Electromagnetic interference analysis method and apparatus

Means of calculating power consumption characteristic and method th...

Patents Applicationslast 30 patents

Operation analysis method of semiconductor integrated circuit

Semiconductor device, method of generating pattern for semiconducto...

Method of designing a semiconductor integrated circuit

Method of analyzing operation of semiconductor integrated circuit d...

Resistance value calculation method

Design method for semiconductor integrated circuit suppressing powe...

Method for analyzing power supply noise of semiconductor integrated...

Semiconductor device method of generating semiconductor device patt...

Substrate noise analyzing method for semiconductor integrated circu...

Operation analyzing method for semiconductor integrated circuit dev...

Electromagnetic interference analysis method and apparatus

Electromagnetic disturbance analysis method and apparatus and semic...

Method and apparatus for analyzing electromagnetic interference

Method for optimizing electromagnetic interference and method for a...

Electromagnetic interference analysis method and apparatus