Kenji Takamoto

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 6,114,695
- Issue date Sep 5, 2000
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 5,969,357
- Issue date Oct 19, 1999
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 5,866,904
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 5,594,245
- Issue date Jan 14, 1997
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for production of semicondu...
- Patent number 5,412,210
- Issue date May 2, 1995
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method and production of semi-cond...
- Patent number 5,202,564
- Issue date Apr 13, 1993
- Hitachi, Ltd.
- Hideo Todokoro