Kenji Takubo

Person

Uji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device and defect detection method
- Patent number 12,099,000
- Issue date Sep 24, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for examining clinched portion of tubular body
- Patent number 11,982,641
- Issue date May 14, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement device and defect detection device
- Patent number 11,977,032
- Issue date May 7, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,815,493
- Issue date Nov 14, 2023
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,790,513
- Issue date Oct 17, 2023
- Shimadzu Corporation
- Koki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interference image imaging apparatus
- Patent number 11,774,746
- Issue date Oct 3, 2023
- Shimadzu Corporation
- Takahide Hatahori
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect detection device
- Patent number 11,391,700
- Issue date Jul 19, 2022
- Samsung Electronics Co., Ltd.
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 11,226,294
- Issue date Jan 18, 2022
- Shimadzu Corporation
- Takahide Hatahori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection method and device
- Patent number 11,193,887
- Issue date Dec 7, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,181,510
- Issue date Nov 23, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and method
- Patent number 10,942,152
- Issue date Mar 9, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device
- Patent number 10,429,172
- Issue date Oct 1, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 10,317,190
- Issue date Jun 11, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection apparatus
- Patent number 10,267,618
- Issue date Apr 23, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Photodiode array for spectrometric measurements and spectrometric m...
- Patent number 9,429,471
- Issue date Aug 30, 2016
- Shimadzu Corporation
- Hideki Tominaga
- G01 - MEASURING TESTING
Information Patent Grant
Solid state image sensor and method for driving the same
- Patent number 9,030,582
- Issue date May 12, 2015
- Shimadzu Corporation
- Shigetoshi Sugawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Solid-state image sensor
- Patent number 8,530,947
- Issue date Sep 10, 2013
- Shimadzu Corporation
- Yasushi Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas concentration measurement device
- Patent number 8,508,739
- Issue date Aug 13, 2013
- Shimadzu Corporation
- Yousuke Hoshino
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating dielectrophoretic intensity of...
- Patent number 8,313,628
- Issue date Nov 20, 2012
- Shimadzu Corporation
- Yoshio Tsunazawa
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Optical measuring device
- Patent number 7,911,610
- Issue date Mar 22, 2011
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Grant
In-situ storage image sensor and in-situ storage image pickup appar...
- Patent number 7,432,971
- Issue date Oct 7, 2008
- Shimadzu Corporation
- Kenji Takubo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photographic apparatus and photographic method using same
- Patent number 7,394,484
- Issue date Jul 1, 2008
- Shimadzu Corporation
- Hideki Soya
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Quantum Absorption Spectroscopy
- Publication number 20240319081
- Publication date Sep 26, 2024
- Shimadzu Corporation
- Hideaki KATSU
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240230601
- Publication date Jul 11, 2024
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230304787
- Publication date Sep 28, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20230251204
- Publication date Aug 10, 2023
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230236111
- Publication date Jul 27, 2023
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, IMAGE PROCESSING METHOD, AND DEFECT INSPECTION D...
- Publication number 20230114484
- Publication date Apr 13, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20230085940
- Publication date Mar 23, 2023
- Shimadzu Corporation
- Takahide HATAHORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20230062821
- Publication date Mar 2, 2023
- Shimadzu Corporation
- Koki YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR EXAMINING CLINCHED PORTION OF TUBULAR BODY
- Publication number 20220229020
- Publication date Jul 21, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE IMAGE IMAGING APPARATUS
- Publication number 20220179196
- Publication date Jun 9, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220180500
- Publication date Jun 9, 2022
- Shimadzu Corporation
- Koki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220051390
- Publication date Feb 17, 2022
- Shimadzu Corporation
- Koki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE
- Publication number 20220034822
- Publication date Feb 3, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220026396
- Publication date Jan 27, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE
- Publication number 20210270777
- Publication date Sep 2, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEVICE
- Publication number 20210164897
- Publication date Jun 3, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20210096085
- Publication date Apr 1, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20210080399
- Publication date Mar 18, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200191751
- Publication date Jun 18, 2020
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
SOUND-WAVE-PROPAGATION VISUALIZATION DEVICE AND METHOD
- Publication number 20190204275
- Publication date Jul 4, 2019
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE
- Publication number 20180356205
- Publication date Dec 13, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20180283847
- Publication date Oct 4, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS
- Publication number 20170350690
- Publication date Dec 7, 2017
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
LINEAR IMAGE SENSOR AND DRIVING METHOD THEREFOR
- Publication number 20150296160
- Publication date Oct 15, 2015
- TOHOKU UNIVERSITY
- Hideki Tominaga
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC M...
- Publication number 20150048239
- Publication date Feb 19, 2015
- TOHOKU UNIVERSITY
- Hideki Tominaga
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE IMAGE SENSOR AND METHOD FOR DRIVING THE SAME
- Publication number 20130308023
- Publication date Nov 21, 2013
- Shimadzu Corporation
- Shigetoshi Sugawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Gas Concentration Measurement Device
- Publication number 20120188549
- Publication date Jul 26, 2012
- Shimadzu Corporation
- Yousuke Hoshino
- G01 - MEASURING TESTING
Information Patent Application
Solid-State Image Sensor
- Publication number 20120112255
- Publication date May 10, 2012
- TOHOKU UNIVERSITY
- Yasushi Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING DIELECTROPHORETIC INTENSITY OF...
- Publication number 20100012496
- Publication date Jan 21, 2010
- Yoshio Tsunazawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20090251695
- Publication date Oct 8, 2009
- Naoji Moriya
- G01 - MEASURING TESTING

Kenji Takubo

Person

Patents Grantslast 30 patents

Vibration measurement device

Defect detection device and defect detection method

Method and device for examining clinched portion of tubular body

Displacement measurement device and defect detection device

Defect inspection apparatus and defect inspection method

Defect inspection apparatus and defect inspection method

Interference image imaging apparatus

Defect detection device

Defect inspection apparatus

Defect detection method and device

Inspection apparatus and inspection method

Defect inspection device and method

Defect detection method and defect detection device

Vibration measurement device

Defect detection method and defect detection apparatus

Photodiode array for spectrometric measurements and spectrometric m...

Solid state image sensor and method for driving the same

Solid-state image sensor

Gas concentration measurement device

Method and apparatus for evaluating dielectrophoretic intensity of...

Optical measuring device

In-situ storage image sensor and in-situ storage image pickup appar...

Photographic apparatus and photographic method using same

Patents Applicationslast 30 patents

System and Method for Quantum Absorption Spectroscopy

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

DEFECT INSPECTION APPARATUS

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

INSPECTION SYSTEM, IMAGE PROCESSING METHOD, AND DEFECT INSPECTION D...

Defect Inspection Apparatus and Defect Inspection Method

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

METHOD AND DEVICE FOR EXAMINING CLINCHED PORTION OF TUBULAR BODY

INTERFERENCE IMAGE IMAGING APPARATUS

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT DETECTION DEVICE

DEFECT DETECTION METHOD AND DEVICE

VIBRATION MEASUREMENT DEVICE

DEFECT INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

SOUND-WAVE-PROPAGATION VISUALIZATION DEVICE AND METHOD

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE

VIBRATION MEASUREMENT DEVICE

DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS

LINEAR IMAGE SENSOR AND DRIVING METHOD THEREFOR

PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC M...

SOLID STATE IMAGE SENSOR AND METHOD FOR DRIVING THE SAME

Gas Concentration Measurement Device

Solid-State Image Sensor

METHOD AND APPARATUS FOR EVALUATING DIELECTROPHORETIC INTENSITY OF...

OPTICAL MEASURING DEVICE