Kenji Taniguchi

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Suita-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Simulator and parameter extraction device for transistor, simulatio...
- Patent number 7,711,526
- Issue date May 4, 2010
- Sharp Kabushiki Kaisha
- Kazuhiro Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring free carrier concentration and/or thickness of...
- Patent number 6,153,444
- Issue date Nov 28, 2000
- Murata Manufacturing Co., Ltd.
- Hiroyuki Nakano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Simulator and parameter extraction device for transistor, simulator...
- Publication number 20050015235
- Publication date Jan 20, 2005
- Sharp Kabushiki Kaisha
- Kazuhiro Maeda
- G06 - COMPUTING CALCULATING COUNTING