Kenji Wakasaya

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Akishima-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus
- Patent number 9,618,461
- Issue date Apr 11, 2017
- Rigaku Corporation
- Takao Ohara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optical component device and X-ray analyzer
- Patent number 9,490,038
- Issue date Nov 8, 2016
- Rigaku Corporation
- Kenji Wakasaya
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Motion control system and X-ray measurement apparatus
- Patent number 8,712,013
- Issue date Apr 29, 2014
- Rigaku Corporation
- Tetsuo Kani
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY OPTICAL COMPONENT DEVICE AND X-RAY ANALYZER
- Publication number 20150098547
- Publication date Apr 9, 2015
- Rigaku Corporation
- Kenji Wakasaya
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20140105368
- Publication date Apr 17, 2014
- Rigaku Corporation
- Takao OHARA
- G01 - MEASURING TESTING
Information Patent Application
MOTION CONTROL SYSTEM AND X-RAY MEASUREMENT APPARATUS
- Publication number 20120053733
- Publication date Mar 1, 2012
- Rigaku Corporation
- Tetsuo KANI
- G05 - CONTROLLING REGULATING