Kenji YAMASAKI

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning type probe microscope and control device for scanning type...
- Patent number 11,454,647
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and optical axis adjustment method in sca...
- Patent number 11,346,856
- Issue date May 31, 2022
- Shimadzu Corporation
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and optical axis adjustment method in sca...
- Patent number 11,162,974
- Issue date Nov 2, 2021
- Shimadzu Corporation
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device for scanning probe microscope
- Patent number 10,871,505
- Issue date Dec 22, 2020
- SHIMADZIJ CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Data correction method, computer program for causing computer to pe...
- Patent number 10,846,547
- Issue date Nov 24, 2020
- Shimadzu Corporation
- Masato Hirade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,641,790
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240426870
- Publication date Dec 26, 2024
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...
- Publication number 20220358636
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTIT...
- Publication number 20210316986
- Publication date Oct 14, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...
- Publication number 20210311091
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...
- Publication number 20210302465
- Publication date Sep 30, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...
- Publication number 20210263068
- Publication date Aug 26, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190383855
- Publication date Dec 19, 2019
- SHIMADZU CORPORATION
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190324053
- Publication date Oct 24, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
DATA CORRECTION METHOD, COMPUTER PROGRAM FOR CAUSING COMPUTER TO PE...
- Publication number 20190294905
- Publication date Sep 26, 2019
- Shimadzu Corporation
- Masato HIRADE
- G06 - COMPUTING CALCULATING COUNTING

Kenji YAMASAKI

Person

Patents Grantslast 30 patents

Scanning type probe microscope and control device for scanning type...

Scanning probe microscope and optical axis adjustment method in sca...

Scanning probe microscope and optical axis adjustment method in sca...

Data processing device for scanning probe microscope

Data correction method, computer program for causing computer to pe...

Scanning probe microscope

Scanning probe microscope and light intensity adjusting method

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE

PROBE ASSESSMENT METHOD AND SPM

ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTIT...

SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...

SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...

SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...

DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD

SCANNING PROBE MICROSCOPE

DATA CORRECTION METHOD, COMPUTER PROGRAM FOR CAUSING COMPUTER TO PE...