Kenjiro Kimura

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scattering tomography device and scattering tomography method
- Patent number 12,158,436
- Issue date Dec 3, 2024
- INTEGRAL GEOMETRY SCIENCE INC.
- Kenjiro Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
External field response distribution visualization device and exter...
- Patent number 12,105,159
- Issue date Oct 1, 2024
- National University Corporation Kobe University
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic response distribution visualization device, security inspe...
- Patent number 12,050,301
- Issue date Jul 30, 2024
- INTEGRAL GEOMETRY SCIENCE INC.
- Noriaki Kimura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Storage battery inspection device and storage battery inspection me...
- Patent number 11,828,811
- Issue date Nov 28, 2023
- INTEGRAL GEOMETRY SCIENCE INC.
- Yuki Mima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method and observation device
- Patent number 11,422,110
- Issue date Aug 23, 2022
- National University Corporation Kobe University
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and measurement method
- Patent number 11,366,079
- Issue date Jun 21, 2022
- National University Corporation Kobe University
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Observation method and observation device
- Patent number 11,041,826
- Issue date Jun 22, 2021
- National University Corporation Kobe University
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Imaging method and imaging apparatus
- Patent number 10,586,354
- Issue date Mar 10, 2020
- National University Corporation Kobe University
- Kenjiro Kimura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scattering tomography method and scattering tomography device
- Patent number 10,578,552
- Issue date Mar 3, 2020
- INTEGRAL GEOMETRY SCIENCE INC.
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Conductivity distribution derivation method and conductivity distri...
- Patent number 10,254,352
- Issue date Apr 9, 2019
- National University Corporation Kobe University
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Scattering tomography method and scattering tomography device
- Patent number 10,101,282
- Issue date Oct 16, 2018
- National University Corporation Kobe University
- Kenjiro Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distribution analysis device
- Patent number 9,568,567
- Issue date Feb 14, 2017
- National University Corporation Kobe University
- Kenjiro Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan device for microscope measurement instrument
- Patent number 8,796,654
- Issue date Aug 5, 2014
- Shimadzu Coporation
- Masahiro Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method of obtaining field by measurement
- Patent number 8,536,862
- Issue date Sep 17, 2013
- Kyoto University
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam irradiation device
- Patent number 7,829,863
- Issue date Nov 9, 2010
- Kyoto University
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
INSPECTING DEVICE AND INSPECTING METHOD
- Publication number 20240302419
- Publication date Sep 12, 2024
- Integral Geometry Science Inc.
- Shogo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE AND IMAGING METHOD
- Publication number 20240295506
- Publication date Sep 5, 2024
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE AND IMAGING METHOD
- Publication number 20240280361
- Publication date Aug 22, 2024
- Integral Geometry Science Inc.
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
AIR PURIFICATION SYSTEM AND PROTECTIVE CLOTHING
- Publication number 20230285625
- Publication date Sep 14, 2023
- Integral Geometry Science Inc.
- Kenjiro KIMURA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MAGNETIC RESPONSE DISTRIBUTION VISUALIZATION DEVICE, SECURITY INSPE...
- Publication number 20230152482
- Publication date May 18, 2023
- Integral Geometry Science Inc.
- Noriaki KIMURA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
EXTERNAL FIELD RESPONSE DISTRIBUTION VISUALIZATION DEVICE AND EXTER...
- Publication number 20220413066
- Publication date Dec 29, 2022
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
STORAGE BATTERY INSPECTION DEVICE AND STORAGE BATTERY INSPECTION ME...
- Publication number 20220349943
- Publication date Nov 3, 2022
- Integral Geometry Science Inc.
- Yuki MIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCATTERING TOMOGRAPHY DEVICE AND SCATTERING TOMOGRAPHY METHOD
- Publication number 20220319067
- Publication date Oct 6, 2022
- Integral Geometry Science Inc.
- Noriaki KIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCATTERING TOMOGRAPHY DEVICE AND SCATTERING TOMOGRAPHY METHOD
- Publication number 20220268711
- Publication date Aug 25, 2022
- Integral Geometry Science Inc.
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION METHOD AND OBSERVATION DEVICE
- Publication number 20210148860
- Publication date May 20, 2021
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20190120796
- Publication date Apr 25, 2019
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION METHOD AND OBSERVATION DEVICE
- Publication number 20180328887
- Publication date Nov 15, 2018
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING METHOD AND IMAGING APPARATUS
- Publication number 20180308259
- Publication date Oct 25, 2018
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONDUCTIVITY DISTRIBUTION DERIVATION METHOD AND CONDUCTIVITY DISTRI...
- Publication number 20170016963
- Publication date Jan 19, 2017
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING TOMOGRAPHY METHOD AND SCATTERING TOMOGRAPHY DEVICE
- Publication number 20160377557
- Publication date Dec 29, 2016
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
DISTRIBUTION ANALYZING DEVICE AND DISTRIBUTION ANALYZING METHOD
- Publication number 20160018484
- Publication date Jan 21, 2016
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING TOMOGRAPHY METHOD AND SCATTERING TOMOGRAPHY DEVICE
- Publication number 20150377778
- Publication date Dec 31, 2015
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
DISTRIBUTION ANALYSIS DEVICE
- Publication number 20140081584
- Publication date Mar 20, 2014
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Application
Scan Device
- Publication number 20110261352
- Publication date Oct 27, 2011
- SHIMADZU CORPORATION
- Masahiro Ohta
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT
- Publication number 20100219819
- Publication date Sep 2, 2010
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Irradiation Device
- Publication number 20090127473
- Publication date May 21, 2009
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY

Kenjiro Kimura

Person

Patents Grantslast 30 patents

Scattering tomography device and scattering tomography method

External field response distribution visualization device and exter...

Magnetic response distribution visualization device, security inspe...

Storage battery inspection device and storage battery inspection me...

Observation method and observation device

Measurement device and measurement method

Observation method and observation device

Imaging method and imaging apparatus

Scattering tomography method and scattering tomography device

Conductivity distribution derivation method and conductivity distri...

Scattering tomography method and scattering tomography device

Distribution analysis device

Scan device for microscope measurement instrument

Apparatus and method of obtaining field by measurement

Electron beam irradiation device

Patents Applicationslast 30 patents

INSPECTING DEVICE AND INSPECTING METHOD

IMAGING DEVICE AND IMAGING METHOD

IMAGING DEVICE AND IMAGING METHOD

AIR PURIFICATION SYSTEM AND PROTECTIVE CLOTHING

MAGNETIC RESPONSE DISTRIBUTION VISUALIZATION DEVICE, SECURITY INSPE...

EXTERNAL FIELD RESPONSE DISTRIBUTION VISUALIZATION DEVICE AND EXTER...

STORAGE BATTERY INSPECTION DEVICE AND STORAGE BATTERY INSPECTION ME...

SCATTERING TOMOGRAPHY DEVICE AND SCATTERING TOMOGRAPHY METHOD

SCATTERING TOMOGRAPHY DEVICE AND SCATTERING TOMOGRAPHY METHOD

OBSERVATION METHOD AND OBSERVATION DEVICE

MEASUREMENT DEVICE AND MEASUREMENT METHOD

OBSERVATION METHOD AND OBSERVATION DEVICE

IMAGING METHOD AND IMAGING APPARATUS

CONDUCTIVITY DISTRIBUTION DERIVATION METHOD AND CONDUCTIVITY DISTRI...

SCATTERING TOMOGRAPHY METHOD AND SCATTERING TOMOGRAPHY DEVICE

DISTRIBUTION ANALYZING DEVICE AND DISTRIBUTION ANALYZING METHOD

SCATTERING TOMOGRAPHY METHOD AND SCATTERING TOMOGRAPHY DEVICE

DISTRIBUTION ANALYSIS DEVICE

Scan Device

APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT

Electron Beam Irradiation Device