Kenneth A. Lavallee

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Colchester, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Low-voltage IC test for defect screening
- Patent number 9,285,417
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Daniel J. Poindexter
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining common failure modes for integrat...
- Patent number 6,557,132
- Issue date Apr 29, 2003
- International Business Machines Corporation
- David V. Gangl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOW-VOLTAGE IC TEST FOR DEFECT SCREENING
- Publication number 20140184262
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Daniel J. Poindexter
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for providing accurate junction temperature in...
- Publication number 20040066837
- Publication date Apr 8, 2004
- Joshua W. Armour
- G01 - MEASURING TESTING
Information Patent Application
Method and system for determining common failure modes for integrat...
- Publication number 20020116675
- Publication date Aug 22, 2002
- International Business Machines Corporation
- David V. Gangl
- G01 - MEASURING TESTING