Kenneth Ashley Macon

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Longmont, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Arrayed imaging systems having improved alignment and associated me...
- Patent number 10,002,215
- Issue date Jun 19, 2018
- OmniVision Technologies, Inc.
- Edward R. Dowski
- B24 - GRINDING POLISHING
Information Patent Grant
System and method for optimizing optical and digital system designs
- Patent number 7,860,699
- Issue date Dec 28, 2010
- OmniVision Technologies, Inc.
- Edward R. Dowski, Jr.
- G02 - OPTICS
Information Patent Grant
System and method for optimizing optical and digital system designs
- Patent number 7,469,202
- Issue date Dec 23, 2008
- OmniVision CDM Optics, Inc.
- Edward R. Dowski, Jr.
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ARRAYED IMAGING SYSTEMS HAVING IMPROVED ALIGNMENT AND ASSOCIATED ME...
- Publication number 20160350445
- Publication date Dec 1, 2016
- Omnivision Technologies Inc.
- Edward R. Dowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARRAYED IMAGING SYSTEMS HAVING IMPROVED ALIGNMENT AND ASSOCIATED ME...
- Publication number 20140220713
- Publication date Aug 7, 2014
- Omnivision Technologies Inc.
- Edward R. Dowski
- G02 - OPTICS
Information Patent Application
Arrayed Imaging Systems And Associated Methods
- Publication number 20100165134
- Publication date Jul 1, 2010
- Edward R. Dowski, JR.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System And Method For Optimizing Optical And Digital System Designs
- Publication number 20090143874
- Publication date Jun 4, 2009
- Edward R. Dowski, JR.
- G02 - OPTICS
Information Patent Application
ABERRATION-TOLERANT FAR INFRARED IMAGING SYSTEMS
- Publication number 20070263280
- Publication date Nov 15, 2007
- CDM OPTICS, INC.
- Kenneth Ashley Macon
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for optimizing optical and digital system designs
- Publication number 20050197809
- Publication date Sep 8, 2005
- Edward R. Dowski
- G02 - OPTICS