Kenneth B. Eisenthal

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Ridgewood, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical quantification of interfacial charge states
- Patent number 10,514,585
- Issue date Dec 24, 2019
- Northwestern University
- Franz M. Geiger
- G02 - OPTICS
Information Patent Grant
Optical quantification of interfacial charge states
- Patent number 10,274,807
- Issue date Apr 30, 2019
- Northwestern University
- Franz M. Geiger
- G02 - OPTICS
Information Patent Grant
Attachment of second harmonic-active moiety to molecules for detect...
- Patent number 6,953,694
- Issue date Oct 11, 2005
- The Trustees of Columbia University In the City of New York
- Joshua S. Salafsky
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining surface properties of microparticles
- Patent number 6,055,051
- Issue date Apr 25, 2000
- The Trustees of Columbia University In the City of New York
- Kenneth B. Eisenthal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL QUANTIFICATION OF INTERFACIAL CHARGE STATES
- Publication number 20190204712
- Publication date Jul 4, 2019
- Battelle Memorial Institute
- Franz M. Geiger
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL QUANTIFICATION OF INTERFACIAL CHARGE STATES
- Publication number 20180164657
- Publication date Jun 14, 2018
- Northwestern University
- Franz M. Geiger
- G02 - OPTICS
Information Patent Application
METHODS DEVICES AND SYSTEMS FOR OPTICAL PROBING OF MOLECULAR STRUCT...
- Publication number 20140248709
- Publication date Sep 4, 2014
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Kenneth B. EISENTHAL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR MEASURING AFFINITY CONSTANTS
- Publication number 20120202296
- Publication date Aug 9, 2012
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Kenneth B. Eisenthal
- G01 - MEASURING TESTING
Information Patent Application
Attachment of second harmonic-active moiety to molecules for detect...
- Publication number 20020094520
- Publication date Jul 18, 2002
- Joshua S. Salafsky
- G01 - MEASURING TESTING