Kenneth C. Harvey

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam exciter for use in chemical analysis in processing sy...
- Patent number 9,997,325
- Issue date Jun 12, 2018
- Verity Instruments, Inc.
- Jimmy W. Hosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration of a radiometric optical monitoring system used for fau...
- Patent number 8,125,633
- Issue date Feb 28, 2012
- Verity Instruments, Inc.
- Mike Whelan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing the effects of window clouding on...
- Patent number 7,630,859
- Issue date Dec 8, 2009
- Verity Instruments, Inc.
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne reflectometer for film thickness monitoring and method f...
- Patent number 7,339,682
- Issue date Mar 4, 2008
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining endpoint in etch processes using...
- Patent number 6,830,939
- Issue date Dec 14, 2004
- Verity Instruments, Inc.
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving performance and reliability of MOS technologie...
- Patent number 6,326,274
- Issue date Dec 4, 2001
- Texas Instruments Incorporated
- Timothy A. Rost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving performance and reliability of MOS technologie...
- Patent number 6,221,705
- Issue date Apr 24, 2001
- Texas Instruments Incorporated
- Timothy A. Rost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deuterium sintering with rapid quenching
- Patent number 6,071,751
- Issue date Jun 6, 2000
- Texas Instruments Incorporated
- Robert M. Wallace
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to enhance deuterium anneal/implant to reduce channel-hot ca...
- Patent number 6,017,806
- Issue date Jan 25, 2000
- Texas Instruments Incorporated
- Kenneth C. Harvey
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron beam exciter for use in chemical analysis in processing sy...
- Publication number 20100032587
- Publication date Feb 11, 2010
- Jimmy W. Hosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Calibration of a radiometric optical monitoring system used for fau...
- Publication number 20090103081
- Publication date Apr 23, 2009
- Verity Instruments, Inc.
- Mike Whelan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reducing the effects of window clouding on...
- Publication number 20080275658
- Publication date Nov 6, 2008
- Verity Instruments, Inc.
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Application
Multichannel array as window protection
- Publication number 20080233016
- Publication date Sep 25, 2008
- Verity Instruments, Inc.
- Kenneth C. Harvey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Heterodyne reflectomer for film thickness monitoring and method for...
- Publication number 20060192973
- Publication date Aug 31, 2006
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Application
System and method for determining endpoint in etch processes using...
- Publication number 20040045934
- Publication date Mar 11, 2004
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Application
Method for improving performance and reliability of MOS technologie...
- Publication number 20010007785
- Publication date Jul 12, 2001
- Timothy A. Rost
- H01 - BASIC ELECTRIC ELEMENTS

Kenneth C. Harvey

Person

Patents Grantslast 30 patents

Electron beam exciter for use in chemical analysis in processing sy...

Calibration of a radiometric optical monitoring system used for fau...

Method and apparatus for reducing the effects of window clouding on...

Heterodyne reflectometer for film thickness monitoring and method f...

System and method for determining endpoint in etch processes using...

Method for improving performance and reliability of MOS technologie...

Method for improving performance and reliability of MOS technologie...

Deuterium sintering with rapid quenching

Method to enhance deuterium anneal/implant to reduce channel-hot ca...

Patents Applicationslast 30 patents

Electron beam exciter for use in chemical analysis in processing sy...

Calibration of a radiometric optical monitoring system used for fau...

Method and apparatus for reducing the effects of window clouding on...

Multichannel array as window protection

Heterodyne reflectomer for film thickness monitoring and method for...

System and method for determining endpoint in etch processes using...

Method for improving performance and reliability of MOS technologie...