Kenneth Carl Larsen

Person

Georgetown, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,479,796
- Issue date Jan 20, 2009
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,466,155
- Issue date Dec 16, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,463,017
- Issue date Dec 9, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,456,644
- Issue date Nov 25, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,453,279
- Issue date Nov 18, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,425,822
- Issue date Sep 16, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,423,440
- Issue date Sep 9, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,405,583
- Issue date Jul 29, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,352,200
- Issue date Apr 1, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for functional and stress testing of exposed chip land gr...
- Patent number 6,911,836
- Issue date Jun 28, 2005
- International Business Machines Corporation
- Lonnie J. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Cage assembly for front service access and method of use
- Patent number 6,535,391
- Issue date Mar 18, 2003
- International Business Machines Corporation
- Kenneth Carl Larsen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-axis microprocess or docking mechanism
- Patent number 6,229,708
- Issue date May 8, 2001
- International Business Machines Corporation
- John Saunders Corbin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070210819
- Publication date Sep 13, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205796
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205756
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205758
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205757
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205773
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205797
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205786
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
Functional and stress testing of LGA devices
- Publication number 20060152237
- Publication date Jul 13, 2006
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for functional and stress testing of exposed chip land gr...
- Publication number 20050040838
- Publication date Feb 24, 2005
- International Business Machines Corporation
- Lonnie J. Cannon
- G01 - MEASURING TESTING
Information Patent Application
Cage assembly for front service access and method of use
- Publication number 20020159241
- Publication date Oct 31, 2002
- International Business Machines Corporation
- Kenneth Carl Larsen
- G06 - COMPUTING CALCULATING COUNTING

Kenneth Carl Larsen

Person

Patents Grantslast 30 patents

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Apparatus for functional and stress testing of exposed chip land gr...

Cage assembly for front service access and method of use

Multi-axis microprocess or docking mechanism

Patents Applicationslast 30 patents

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

Functional and stress testing of LGA devices

Apparatus for functional and stress testing of exposed chip land gr...

Cage assembly for front service access and method of use