Kenneth D. Van Antwerp, JR.

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Colorado Springs, CO, US

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Patents Applicationslast 30 patents

Information Patent Application
Vacuum Quality Measurement System
- Publication number 20120227465
- Publication date Sep 13, 2012
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Emission Current And Bias Potential Control
- Publication number 20110163754
- Publication date Jul 7, 2011
- Brooks Automation, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING