Kenneth D. Van Antwerp Jr.

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Colorado Springs, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Vacuum quality measurement system
- Patent number 9,322,738
- Issue date Apr 26, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 8,947,098
- Issue date Feb 3, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic ion trap
- Patent number 8,586,918
- Issue date Nov 19, 2013
- Brooks Automation, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for electronically tracking containers to avoid misprocessin...
- Patent number 6,138,058
- Issue date Oct 24, 2000
- Jenoptik Infab, Inc.
- Kenneth D. Van Antwerp
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED FAN INTEGRATION IN DATA STORAGE SYSTEMS
- Publication number 20240155814
- Publication date May 9, 2024
- Sanmina Corporation
- Odie Banks Killen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Electrostatic Ion Trap
- Publication number 20120112056
- Publication date May 10, 2012
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS