Kenneth Dubowski

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Die-to-die interface configuration and methods of use thereof
- Patent number 10,424,921
- Issue date Sep 24, 2019
- QUALCOMM Incorporated
- Kenneth Dubowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable pad capacitance for supporting bidirectional signaling...
- Patent number 9,767,889
- Issue date Sep 19, 2017
- QUALCOMM Incorporated
- Scott Powers
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Cascaded test chain for stuck-at fault verification
- Patent number 9,111,848
- Issue date Aug 18, 2015
- QUALCOMM Incorporated
- Kenneth Dubowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Die-to-Die Interface Configuration and Methods of Use Thereof
- Publication number 20180233907
- Publication date Aug 16, 2018
- QUALCOMM Incorporated
- Kenneth Dubowski
- H01 - BASIC ELECTRIC ELEMENTS