Kenneth Durden

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Vadnais Heights, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method of characterizing micro-fabrication processes
- Patent number 10,024,804
- Issue date Jul 17, 2018
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Grant
System and method of characterizing micro-fabrication processes
- Patent number 9,658,169
- Issue date May 23, 2017
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Grant
All surface data for use in substrate inspection
- Patent number 7,835,566
- Issue date Nov 16, 2010
- Rudolph Technologies, Inc.
- David Reich
- G01 - MEASURING TESTING
Information Patent Grant
All surface data for use in substrate inspection
- Patent number 7,593,565
- Issue date Sep 22, 2009
- Rudolph Technologies, Inc.
- David Reich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20170254757
- Publication date Sep 7, 2017
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20150316487
- Publication date Nov 5, 2015
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20140320635
- Publication date Oct 30, 2014
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
ALL SURFACE DATA FOR USE IN SUBSTRATE INSPECTION
- Publication number 20100067779
- Publication date Mar 18, 2010
- Rudolph Technologies, Inc.
- David Reich
- G01 - MEASURING TESTING
Information Patent Application
All surface data for use in substrate inspection
- Publication number 20060142971
- Publication date Jun 29, 2006
- David Reich
- G01 - MEASURING TESTING