Kenneth F. Hollman

Person

San Marcos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High resolution analytical probe station
- Patent number 7,180,317
- Issue date Feb 20, 2007
- The Micromanipulator Co., Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for maintaining accurate positioning between a...
- Patent number 7,043,848
- Issue date May 16, 2006
- The Micromanipulator Company
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station
- Patent number 6,917,195
- Issue date Jul 12, 2005
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
High resolution analytical probe station
- Patent number 6,838,895
- Issue date Jan 4, 2005
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station
- Patent number 6,803,756
- Issue date Oct 12, 2004
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
High resolution analytical probe station
- Patent number 6,744,268
- Issue date Jun 1, 2004
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Triaxial probe assembly
- Patent number 6,700,397
- Issue date Mar 2, 2004
- The Micromanipulator Company, Inc.
- Kenneth Hollman
- G01 - MEASURING TESTING
Information Patent Grant
High resolution analytical probe station
- Patent number 6,621,282
- Issue date Sep 16, 2003
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station
- Patent number 6,424,141
- Issue date Jul 23, 2002
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
High Resolution analytical probe station
- Patent number 6,198,299
- Issue date Mar 6, 2001
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
High resolution analytical probe station
- Patent number 6,191,598
- Issue date Feb 20, 2001
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Probing with backside emission microscopy
- Patent number 5,783,835
- Issue date Jul 21, 1998
- Probing Solutions, Incorporated
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly including touchdown sensor
- Patent number 4,956,923
- Issue date Sep 18, 1990
- The Micromanipulator Co., Inc.
- James T. Pettingell
- G01 - MEASURING TESTING
Information Patent Grant
Test station
- Patent number 4,893,914
- Issue date Jan 16, 1990
- The Micromanipulator Company, Inc.
- Robert D. Hancock
- G02 - OPTICS
Information Patent Grant
Method and apparatus for low temperature testing of electronic comp...
- Patent number 4,607,220
- Issue date Aug 19, 1986
- The Micromanipulator Co., Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Grant
Ebulliometric hot spot detector
- Patent number 4,466,746
- Issue date Aug 21, 1984
- Hancock; Robert D.
- Robert D. Hancock
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Resolution Analytical Probe Station
- Publication number 20070290703
- Publication date Dec 20, 2007
- THE MICROMANIPULATOR COMPANY, INC.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for maintaining accurate positioning between a...
- Publication number 20050193576
- Publication date Sep 8, 2005
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station
- Publication number 20040227505
- Publication date Nov 18, 2004
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
High resolution analytical probe station
- Publication number 20040207424
- Publication date Oct 21, 2004
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
High resolution analytical probe station
- Publication number 20040056672
- Publication date Mar 25, 2004
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
High resolution analytical probe station
- Publication number 20030042921
- Publication date Mar 6, 2003
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station
- Publication number 20020118009
- Publication date Aug 29, 2002
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
Triaxial probe assembly
- Publication number 20020075027
- Publication date Jun 20, 2002
- The Micromanipulator Company, Inc.
- Kenneth Hollman
- G01 - MEASURING TESTING
Information Patent Application
High resolution analytical probe station
- Publication number 20020000819
- Publication date Jan 3, 2002
- The Micromanipulator Company, Inc.
- Kenneth F. Hollman
- G01 - MEASURING TESTING

Kenneth F. Hollman

Person

Patents Grantslast 30 patents

High resolution analytical probe station

Method and apparatus for maintaining accurate positioning between a...

Wafer probe station

High resolution analytical probe station

Wafer probe station

High resolution analytical probe station

Triaxial probe assembly

High resolution analytical probe station

Wafer probe station

High Resolution analytical probe station

High resolution analytical probe station

Probing with backside emission microscopy

Probe assembly including touchdown sensor

Test station

Method and apparatus for low temperature testing of electronic comp...

Ebulliometric hot spot detector

Patents Applicationslast 30 patents

High Resolution Analytical Probe Station

Method and apparatus for maintaining accurate positioning between a...

Wafer probe station

High resolution analytical probe station

High resolution analytical probe station

High resolution analytical probe station

Wafer probe station

Triaxial probe assembly

High resolution analytical probe station