Kenneth F. Latzko

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Carmel, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Alignment of integrated circuit chip stack
- Patent number 9,171,742
- Issue date Oct 27, 2015
- GlobalFoundries U.S. 2 LLC
- Evan G. Colgan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SER testing for an IC chip using hot underfill
- Patent number 8,288,177
- Issue date Oct 16, 2012
- International Business Machines Corporation
- Michael Gaynes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT OF INTEGRATED CIRCUIT CHIP STACK
- Publication number 20150024549
- Publication date Jan 22, 2015
- International Business Machines Corporation
- Evan G. Colgan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SER Testing for an IC Chip Using Hot Underfill
- Publication number 20120045853
- Publication date Feb 23, 2012
- International Business Machines Corporation
- Michael Gaynes
- G01 - MEASURING TESTING