Kenneth Gilbert Roessler

Person

Boca Ranton, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,577,286
- Issue date Feb 14, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,391,664
- Issue date Jul 19, 2022
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for contamination identification
- Patent number 11,311,917
- Issue date Apr 26, 2022
- Bruker Nano, Inc.
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,040,379
- Issue date Jun 22, 2021
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 10,384,238
- Issue date Aug 20, 2019
- Rave LLC
- Tod Evan Robinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Debris removal from high aspect structures
- Patent number 10,330,581
- Issue date Jun 25, 2019
- Rave LLC
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 9,588,420
- Issue date Mar 7, 2017
- Rave LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 9,285,674
- Issue date Mar 15, 2016
- RAVE LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 8,986,460
- Issue date Mar 24, 2015
- Rave, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 8,741,067
- Issue date Jun 3, 2014
- Rave, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 8,696,818
- Issue date Apr 15, 2014
- Rave LLC
- Tod Evan Robinson
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 8,613,803
- Issue date Dec 24, 2013
- Rave, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Wafer fabrication process
- Patent number 8,562,749
- Issue date Oct 22, 2013
- Rave LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 8,293,019
- Issue date Oct 23, 2012
- Rave, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 8,287,653
- Issue date Oct 16, 2012
- Rave, LLC
- Tod Evan Robinson
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Apparatus and method for direct surface cleaning
- Patent number 8,182,609
- Issue date May 22, 2012
- Rave, LLC
- Jeffrey E. Le Claire
- B08 - CLEANING
Information Patent Grant
Apparatus and method for indirect surface cleaning
- Patent number 7,993,464
- Issue date Aug 9, 2011
- Rave, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Grant
Vertical indent production repair
- Patent number 7,829,360
- Issue date Nov 9, 2010
- Rave, LLC
- Bernabe J. Arruza
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scan data collection for better overall data accurancy
- Patent number 7,547,882
- Issue date Jun 16, 2009
- Rave LLC
- Kenneth Roessler
- G01 - MEASURING TESTING
Information Patent Grant
Scan data collection for better overall data accuracy
- Patent number 7,053,369
- Issue date May 30, 2006
- Rave LLC
- Kenneth Roessler
- G01 - MEASURING TESTING
Information Patent Grant
Scanning force microscope with automatic surface engagement
- Patent number 6,318,159
- Issue date Nov 20, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Controlling motion of a scanning force microscope probe tip moving...
- Patent number 6,234,009
- Issue date May 22, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 6,220,084
- Issue date Apr 24, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for determining side wall profiles using a sca...
- Patent number 6,169,281
- Issue date Jan 2, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 6,167,753
- Issue date Jan 2, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with automatic surface engagement and imp...
- Patent number 6,079,254
- Issue date Jun 27, 2000
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 5,918,274
- Issue date Jun 29, 1999
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Controlling engagement of a scanning microscope probe with a segmen...
- Patent number 5,902,928
- Issue date May 11, 1999
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for protecting a probe tip using active lateral scanning con...
- Patent number 5,801,381
- Issue date Sep 1, 1998
- International Business Machines Corporation
- Edwin Flecha
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
Debris Removal From High Aspect Structures
- Publication number 20230158555
- Publication date May 25, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Application
Debris Removal in High Aspect Structures
- Publication number 20210308724
- Publication date Oct 7, 2021
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
Debris Removal in High Aspect Structures
- Publication number 20190337025
- Publication date Nov 7, 2019
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
Debris Removal from High Aspect Structures
- Publication number 20190271631
- Publication date Sep 5, 2019
- Rave LLC
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTAMINATION IDENTIFICATION
- Publication number 20170189945
- Publication date Jul 6, 2017
- RAVE LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20160266165
- Publication date Sep 15, 2016
- Rave LLC
- TOD EVAN ROBINSON
- B08 - CLEANING
Information Patent Application
DEBRIS REMOVAL IN HIGH ASPECT STRUCTURES
- Publication number 20160263632
- Publication date Sep 15, 2016
- Rave LLC
- TOD EVAN ROBINSON
- B08 - CLEANING
Information Patent Application
APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING
- Publication number 20160170297
- Publication date Jun 16, 2016
- Rave LLC
- JEFFREY E. LECLAIRE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING
- Publication number 20150185602
- Publication date Jul 2, 2015
- RAVE, LLC
- Jeffrey E. LeClaire
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and Method For Indirect Surface Cleaning
- Publication number 20140283873
- Publication date Sep 25, 2014
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Application
Debris Removal in High Aspect Structures
- Publication number 20140176922
- Publication date Jun 26, 2014
- Tod Evan Robinson
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Application
Apparatus And Method For Indirect Surface Cleaning
- Publication number 20140069457
- Publication date Mar 13, 2014
- RAVE, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Application
Apparatus And Method For Indirect Surface Cleaning
- Publication number 20130276818
- Publication date Oct 24, 2013
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Application
Debris Removal in High Aspect Structures
- Publication number 20130037053
- Publication date Feb 14, 2013
- RAVE, LLC
- Tod Evan Robinson
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Application
Wafer Fabrication Process
- Publication number 20120231397
- Publication date Sep 13, 2012
- Rave LLC
- Jeffrey E. Le Claire
- B08 - CLEANING
Information Patent Application
Vertical indent production repair
- Publication number 20090070979
- Publication date Mar 19, 2009
- Bernabe J. Arruza
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Debris removal in high aspect structures
- Publication number 20090071506
- Publication date Mar 19, 2009
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
Apparatus and Method for Indirect Surface Cleaning
- Publication number 20090065024
- Publication date Mar 12, 2009
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Application
APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING
- Publication number 20090038637
- Publication date Feb 12, 2009
- RAV, LLC
- Jeffrey E. LeClaire
- B08 - CLEANING
Information Patent Application
Scan data collection for better overall data accurancy
- Publication number 20060174384
- Publication date Aug 3, 2006
- Rave LLC
- Kenneth Roessler
- G01 - MEASURING TESTING

Kenneth Gilbert Roessler

Person

Patents Grantslast 30 patents

Debris removal from high aspect structures

Debris removal in high aspect structures

Debris removal from high aspect structures

Apparatus and method for contamination identification

Debris removal in high aspect structures

Debris removal in high aspect structures

Debris removal from high aspect structures

Apparatus and method for indirect surface cleaning

Apparatus and method for indirect surface cleaning

Apparatus and method for indirect surface cleaning

Apparatus and method for indirect surface cleaning

Debris removal in high aspect structures

Apparatus and method for indirect surface cleaning

Wafer fabrication process

Apparatus and method for indirect surface cleaning

Debris removal in high aspect structures

Apparatus and method for direct surface cleaning

Apparatus and method for indirect surface cleaning

Vertical indent production repair

Scan data collection for better overall data accurancy

Scan data collection for better overall data accuracy

Scanning force microscope with automatic surface engagement

Controlling motion of a scanning force microscope probe tip moving...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Apparatus and method for determining side wall profiles using a sca...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Scanning force microscope with automatic surface engagement and imp...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Controlling engagement of a scanning microscope probe with a segmen...

Method for protecting a probe tip using active lateral scanning con...

Patents Applicationslast 30 patents

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

Debris Removal From High Aspect Structures

Debris Removal in High Aspect Structures

Debris Removal in High Aspect Structures

Debris Removal from High Aspect Structures

APPARATUS AND METHOD FOR CONTAMINATION IDENTIFICATION

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

DEBRIS REMOVAL IN HIGH ASPECT STRUCTURES

APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING

APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING

Apparatus and Method For Indirect Surface Cleaning

Debris Removal in High Aspect Structures

Apparatus And Method For Indirect Surface Cleaning

Apparatus And Method For Indirect Surface Cleaning

Debris Removal in High Aspect Structures

Wafer Fabrication Process

Vertical indent production repair

Debris removal in high aspect structures

Apparatus and Method for Indirect Surface Cleaning

APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING

Scan data collection for better overall data accurancy