Kenneth H. Marz

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Self test apparatus for identifying partially defective memory
- Patent number 8,055,960
- Issue date Nov 8, 2011
- International Business Machines Corporation
- William V. Huott
- G11 - INFORMATION STORAGE
Information Patent Grant
Self test method and apparatus for identifying partially defective...
- Patent number 7,366,953
- Issue date Apr 29, 2008
- International Business Machines Corporation
- William V. Huott
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Self Test Apparatus for Identifying Partially Defective Memory
- Publication number 20090204762
- Publication date Aug 13, 2009
- International Business Machines Corporation
- William V. Huott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Self test method and apparatus for identifying partially defective...
- Publication number 20060156130
- Publication date Jul 13, 2006
- International Business Machines Corporation
- William V. Huott
- G06 - COMPUTING CALCULATING COUNTING