Kenneth H. Purser

Person

Lexington, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus to control an ion beam
- Patent number 9,029,811
- Issue date May 12, 2015
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual stage scanner for ion beam control
- Patent number 8,993,980
- Issue date Mar 31, 2015
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual mode ion implanter
- Patent number 8,884,244
- Issue date Nov 11, 2014
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for improving extracted ion beam quality using high-tran...
- Patent number 8,466,431
- Issue date Jun 18, 2013
- Varian Semiconductor Equipment Associates, Inc.
- James S. Buff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
End terminations for electrodes used in ion implantation systems
- Patent number 8,309,935
- Issue date Nov 13, 2012
- Varian Semiconductor Equipment Associates, Inc.
- Frank Sinclair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hydrogen implantation with reduced radiation
- Patent number 8,101,488
- Issue date Jan 24, 2012
- Twin Creeks Technologies, Inc.
- Theodore H. Smick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation apparatus
- Patent number 8,044,374
- Issue date Oct 25, 2011
- Twin Creeks Technologies, Inc.
- Geoffrey Ryding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation apparatus and a method
- Patent number 7,989,784
- Issue date Aug 2, 2011
- Twin Creeks Technologies, Inc.
- Hilton Glavish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation apparatus and a method for fluid cooling
- Patent number 7,982,197
- Issue date Jul 19, 2011
- Twin Creeks Technologies, Inc.
- Theodore H. Smick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling the characteristics of implanter ion-beams
- Patent number 7,897,943
- Issue date Mar 1, 2011
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling the characteristics of implanter ion-beams
- Patent number 7,888,660
- Issue date Feb 15, 2011
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broad energy-range ribbon ion beam collimation using a variable-gra...
- Patent number 7,829,866
- Issue date Nov 9, 2010
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for reducing magnetic fields at an implant location
- Patent number 7,807,983
- Issue date Oct 5, 2010
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for shaping a ribbon-shaped ion beam
- Patent number 7,675,047
- Issue date Mar 9, 2010
- Varian Semiconductor Equipment Associates, Inc.
- Svetlana B. Radovanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for improving uniformity of a ribbon beam
- Patent number 7,525,103
- Issue date Apr 28, 2009
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam neutralization in low-energy high-current ribbon-beam implanters
- Patent number 7,439,526
- Issue date Oct 21, 2008
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broad energy-range ribbon ion beam collimation using a variable-gra...
- Patent number 7,414,249
- Issue date Aug 19, 2008
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resonance method for production of intense low-impurity ion beams o...
- Patent number 7,365,340
- Issue date Apr 29, 2008
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Controlling the characteristics of implanter ion-beams
- Patent number 7,351,984
- Issue date Apr 1, 2008
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling the characteristics of implanter ion-beams
- Patent number 7,301,156
- Issue date Nov 27, 2007
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling the characteristics of implanter ion-beams
- Patent number 6,933,507
- Issue date Aug 23, 2005
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broad range ion implanter
- Patent number 5,907,158
- Issue date May 25, 1999
- Ebara Corporation
- Mehran Nasser-Ghodsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for cooling workpieces processed by an ion implan...
- Patent number 5,828,070
- Issue date Oct 27, 1998
- Eaton Corporation
- Adam A. Brailove
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Large area uniform ion beam formation
- Patent number 5,825,038
- Issue date Oct 20, 1998
- Eaton Corporation
- Julian G. Blake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MeV scanning ions implanter
- Patent number 5,719,403
- Issue date Feb 17, 1998
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MeV neutral beam ion implanter
- Patent number 5,693,939
- Issue date Dec 2, 1997
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature AMS detector for ultrasensitive detection of individual c...
- Patent number 5,661,299
- Issue date Aug 26, 1997
- High Voltage Engineering Europa B.V.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Attomole detector
- Patent number 5,621,209
- Issue date Apr 15, 1997
- High Voltage Engineering Europa B.V.
- Kenneth H. Purser
- G01 - MEASURING TESTING
Information Patent Grant
Sensitive mass spectroscopy using molecular fragmentation
- Patent number 5,569,915
- Issue date Oct 29, 1996
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-sensitive molecular identifier
- Patent number 5,438,194
- Issue date Aug 1, 1995
- High Voltage Engineering Europa B.V.
- Reijer Koudijs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DUAL STAGE SCANNER FOR ION BEAM CONTROL
- Publication number 20150108361
- Publication date Apr 23, 2015
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS TO CONTROL AN ION BEAM
- Publication number 20150108362
- Publication date Apr 23, 2015
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTATION APPARATUS
- Publication number 20100327181
- Publication date Dec 30, 2010
- TWIN CREEKS TECHNOLOGIES, INC.
- Geoffrey Ryding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTATION APPARATUS AND A METHOD FOR FLUID COOLING
- Publication number 20100327189
- Publication date Dec 30, 2010
- TWIN CREEKS TECHNOLOGIES, INC.
- Geoffrey Ryding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTATION APPARATUS AND A METHOD
- Publication number 20100327190
- Publication date Dec 30, 2010
- TWIN CREEKS TECHNOLOGIES, INC.
- Hilton Glavish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
END TERMINATIONS FOR ELECTRODES USED IN ION IMPLANTATION SYSTEMS
- Publication number 20100252746
- Publication date Oct 7, 2010
- Varian Semiconductor Equipment Associates, Inc.
- Frank Sinclair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR IMPROVING EXTRACTED ION BEAM QUALITY USING HIGH-TRAN...
- Publication number 20100200768
- Publication date Aug 12, 2010
- Varian Semiconductor Equipment Associates, Inc.
- JAMES BUFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY...
- Publication number 20090121122
- Publication date May 14, 2009
- Varian Semiconductor Equipment Associates, Inc.
- Peter L. Kellerman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Broad energy-range ribbon ion beam collimation using a variable-gra...
- Publication number 20080302972
- Publication date Dec 11, 2008
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for Reducing Magnetic Fields at an Implant Location
- Publication number 20080169426
- Publication date Jul 17, 2008
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controlling the characteristics of implanter ion-beams
- Publication number 20070181832
- Publication date Aug 9, 2007
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for Improving Uniformity of a Ribbon Beam
- Publication number 20070170369
- Publication date Jul 26, 2007
- Varian Semiconductor Equipment Associates, Inc.
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for Shaping a Ribbon-Shaped Ion Beam
- Publication number 20070108390
- Publication date May 17, 2007
- Varian Semiconductor Equipment Associates, Inc.
- Svetlana B. Radovanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controlling the characteristics of implanter ion-beams
- Publication number 20070023697
- Publication date Feb 1, 2007
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resonance method for production of intense low-impurity ion beams o...
- Publication number 20070018114
- Publication date Jan 25, 2007
- Kenneth H. Purser
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Broad energy-range ribbon ion beam collimation using a variable-gra...
- Publication number 20060197029
- Publication date Sep 7, 2006
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam neutralization in low-energy high-current ribbon-beam implanters
- Publication number 20060197037
- Publication date Sep 7, 2006
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controlling the characteristics of implanter ion-beams
- Publication number 20060169924
- Publication date Aug 3, 2006
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controlling the characteristics of implanter ion-beams
- Publication number 20050242294
- Publication date Nov 3, 2005
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Emittance measuring device for ion beams
- Publication number 20040149926
- Publication date Aug 5, 2004
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controlling the characteristics of implanter ion-beams
- Publication number 20040097058
- Publication date May 20, 2004
- Kenneth H. Purser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for scanning a workpiece in a vacuum chamber
- Publication number 20030197133
- Publication date Oct 23, 2003
- Norman L. Turner
- H01 - BASIC ELECTRIC ELEMENTS

Kenneth H. Purser

Person

Patents Grantslast 30 patents

Apparatus to control an ion beam

Dual stage scanner for ion beam control

Dual mode ion implanter

Techniques for improving extracted ion beam quality using high-tran...

End terminations for electrodes used in ion implantation systems

Hydrogen implantation with reduced radiation

Ion implantation apparatus

Ion implantation apparatus and a method

Ion implantation apparatus and a method for fluid cooling

Controlling the characteristics of implanter ion-beams

Controlling the characteristics of implanter ion-beams

Broad energy-range ribbon ion beam collimation using a variable-gra...

Technique for reducing magnetic fields at an implant location

Technique for shaping a ribbon-shaped ion beam

Technique for improving uniformity of a ribbon beam

Beam neutralization in low-energy high-current ribbon-beam implanters

Broad energy-range ribbon ion beam collimation using a variable-gra...

Resonance method for production of intense low-impurity ion beams o...

Controlling the characteristics of implanter ion-beams

Controlling the characteristics of implanter ion-beams

Controlling the characteristics of implanter ion-beams

Broad range ion implanter

System and method for cooling workpieces processed by an ion implan...

Large area uniform ion beam formation

MeV scanning ions implanter

MeV neutral beam ion implanter

Miniature AMS detector for ultrasensitive detection of individual c...

Attomole detector

Sensitive mass spectroscopy using molecular fragmentation

Ultra-sensitive molecular identifier

Patents Applicationslast 30 patents

DUAL STAGE SCANNER FOR ION BEAM CONTROL

APPARATUS TO CONTROL AN ION BEAM

ION IMPLANTATION APPARATUS

ION IMPLANTATION APPARATUS AND A METHOD FOR FLUID COOLING

ION IMPLANTATION APPARATUS AND A METHOD

END TERMINATIONS FOR ELECTRODES USED IN ION IMPLANTATION SYSTEMS

TECHNIQUES FOR IMPROVING EXTRACTED ION BEAM QUALITY USING HIGH-TRAN...

TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY...

Broad energy-range ribbon ion beam collimation using a variable-gra...

Technique for Reducing Magnetic Fields at an Implant Location

Controlling the characteristics of implanter ion-beams

Technique for Improving Uniformity of a Ribbon Beam

Technique for Shaping a Ribbon-Shaped Ion Beam

Controlling the characteristics of implanter ion-beams

Resonance method for production of intense low-impurity ion beams o...

Broad energy-range ribbon ion beam collimation using a variable-gra...

Beam neutralization in low-energy high-current ribbon-beam implanters

Controlling the characteristics of implanter ion-beams

Controlling the characteristics of implanter ion-beams

Emittance measuring device for ion beams

Controlling the characteristics of implanter ion-beams

Method and apparatus for scanning a workpiece in a vacuum chamber