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Kenneth L. McAllister
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Goleta, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Thermal control in variable aperture mechanism for cryogenic enviro...
Patent number
9,323,130
Issue date
Apr 26, 2016
Raytheon Company
Jeffrey P. Yanevich
G01 - MEASURING TESTING
Information
Patent Grant
Variable aperture mechanism for cryogenic environment, and method
Patent number
8,911,163
Issue date
Dec 16, 2014
Raytheon Company
Jeffrey P. Yanevich
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Variable aperture mechanism retention device
Patent number
8,455,826
Issue date
Jun 4, 2013
Raytheon Company
Richard N. Mullins
G01 - MEASURING TESTING
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Patent Grant
Sensor/support system having a stabilization structure affixed to a...
Patent number
6,417,514
Issue date
Jul 9, 2002
Raytheon Company
Arthur A. Eneim
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
THERMAL CONTROL IN VARIABLE APERTURE MECHANISM FOR CRYOGENIC ENVIRO...
Publication number
20140363151
Publication date
Dec 11, 2014
Raytheon Company
Jeffrey P. Yanevich
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE APERTURE MECHANISM FOR CRYOGENIC ENVIRONMENT, AND METHOD
Publication number
20140363149
Publication date
Dec 11, 2014
Raytheon Company
Jeffrey P. Yanevich
G01 - MEASURING TESTING
Information
Patent Application
Variable Aperture Mechanism Retention Device
Publication number
20110253895
Publication date
Oct 20, 2011
Raytheon Company
Richard N. Mullins
G02 - OPTICS