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Kenneth L. Perdue
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Greenwood, IN, US
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last 30 patents
Information
Patent Grant
Probe mapping diagnostic methods
Patent number
6,559,657
Issue date
May 6, 2003
Endress + Hauser GmbH + Co.
William Patrick McCarthy
G01 - MEASURING TESTING
Information
Patent Grant
Method and arrangement for electromagnetic wave distance measuremen...
Patent number
6,122,602
Issue date
Sep 19, 2000
Endress + Hauser GmbH + Co.
Bernhard Michalski
G01 - MEASURING TESTING
Information
Patent Grant
Periodic probe mapping
Patent number
6,078,280
Issue date
Jun 20, 2000
Endress + Hauser GmbH + Co.
Kenneth L. Perdue
G01 - MEASURING TESTING
Information
Patent Grant
Partial probe mapping
Patent number
5,973,637
Issue date
Oct 26, 1999
Endress + Hauser GmbH + Co.
Kenneth Lee Perdue
G01 - MEASURING TESTING
Information
Patent Grant
Processor apparatus and method for a process measurement signal
Patent number
5,884,231
Issue date
Mar 16, 1999
Endress & Hauser GmbH & Co.
Kenneth Lee Perdue
G01 - MEASURING TESTING
Information
Patent Grant
Processor apparatus and method for a process measurement signal
Patent number
5,841,666
Issue date
Nov 24, 1998
Endress + Hauser GmbH + Co.
Kenneth L. Perdue
G01 - MEASURING TESTING
Information
Patent Grant
Sensor apparatus for process measurement
Patent number
5,661,251
Issue date
Aug 26, 1997
Endress + Hauser GmbH + Co.
Donald D. Cummings
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring mass flow rate of a moving medium
Patent number
5,550,537
Issue date
Aug 27, 1996
Endress + Hauser, Inc.
Kenneth L. Perdue
G01 - MEASURING TESTING