Kenneth L. Skala

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Routed event test system and method
- Patent number 8,295,182
- Issue date Oct 23, 2012
- Credence Systems Corporation
- James Jula
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester with cached vector memories
- Patent number 5,925,145
- Issue date Jul 20, 1999
- Credence Systems Corporation
- Gregory Illes
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester with distributed instruction processing
- Patent number 5,894,484
- Issue date Apr 13, 1999
- Credence Systems Corporation
- Gregory Illes
- G01 - MEASURING TESTING
Information Patent Grant
Dual source data distribution system for integrated circuit tester
- Patent number 5,838,694
- Issue date Nov 17, 1998
- Credence Systems Corporation
- Gregory Illes
- G01 - MEASURING TESTING
Information Patent Grant
Virtual channel data distribution system for integrated circuit tester
- Patent number 5,805,610
- Issue date Sep 8, 1998
- Credence Systems Corporation
- Gregory Illes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ROUTED EVENT TEST SYSTEM AND METHOD
- Publication number 20090076761
- Publication date Mar 19, 2009
- Credence Systems Corporation
- James Jula
- G01 - MEASURING TESTING
Information Patent Application
Multi-type test interface system and method
- Publication number 20080238461
- Publication date Oct 2, 2008
- Ken Skala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit tester
- Publication number 20070094557
- Publication date Apr 26, 2007
- Kenneth L. Skala
- G01 - MEASURING TESTING