Kenneth M. Loewenstern

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Warminster, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Two layer probe
- Patent number 4,511,948
- Issue date Apr 16, 1985
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Two layer probe
- Patent number 4,428,026
- Issue date Jan 24, 1984
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Method of using capacitor probe with a semiconductive electrode
- Patent number 4,301,681
- Issue date Nov 24, 1981
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Level measuring system using admittance sensing
- Patent number 4,232,300
- Issue date Nov 4, 1980
- Drexelbrook Controls, Inc.
- William S. Wright
- G08 - SIGNALLING
Information Patent Grant
Admittance measuring system for monitoring the condition of materials
- Patent number 4,146,834
- Issue date Mar 27, 1979
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Admittance measuring system for monitoring the condition of materials
- Patent number 3,993,947
- Issue date Nov 23, 1976
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING