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Kenneth N. Abel
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Vista, CA, US
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last 30 patents
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Patent Grant
Integrated circuit package having a removable test region for testi...
Patent number
4,812,742
Issue date
Mar 14, 1989
Unisys Corporation
Kenneth N. Abel
G01 - MEASURING TESTING
Information
Patent Grant
Method of removing a soldered integrated circuit package from a pri...
Patent number
4,561,586
Issue date
Dec 31, 1985
Burroughs Corporation
Kenneth N. Abel
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor device package
Patent number
4,139,859
Issue date
Feb 13, 1979
Burroughs Corporation
Terrence E. Lewis
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Semiconductor device package
Patent number
3,999,285
Issue date
Dec 28, 1976
Burroughs Corporation
Terrence E. Lewis
H01 - BASIC ELECTRIC ELEMENTS