Kenneth P. Griesser

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
On-die logic analyzer for semiconductor die
- Patent number 8,799,728
- Issue date Aug 5, 2014
- Intel Corporation
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Grant
On-die logic analyzer for semiconductor die
- Patent number 8,589,745
- Issue date Nov 19, 2013
- Intel Corporation
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Grant
On-die logic analyzer for semiconductor die
- Patent number 8,543,776
- Issue date Sep 24, 2013
- Intel Corporation
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Grant
On-die logic analyzer for semiconductor die
- Patent number 8,327,198
- Issue date Dec 4, 2012
- Intel Corporation
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for providing full accessibility to instructio...
- Patent number 6,925,591
- Issue date Aug 2, 2005
- Intel Corporation
- Chandrashekhar S. Patwardhan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for providing test mode access to an instructi...
- Patent number 6,101,578
- Issue date Aug 8, 2000
- Intel Corporation
- Chandrashekhar S. Patwardhan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for providing an optimized compare-and-branch...
- Patent number 5,870,598
- Issue date Feb 9, 1999
- Intel Corporation
- James E. White
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for providing an optimized compare-and-branch...
- Patent number 5,748,950
- Issue date May 5, 1998
- Intel Corporation
- James E. White
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ON-DIE LOGIC ANALYZER FOR SEMICONDUCTOR DIE
- Publication number 20140053026
- Publication date Feb 20, 2014
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Application
On-Die Logic Analyzer For Semiconductor Die
- Publication number 20130103987
- Publication date Apr 25, 2013
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Application
On-Die Logic Analyzer For Semiconductor Die
- Publication number 20130054931
- Publication date Feb 28, 2013
- Tina C. Zhong
- G01 - MEASURING TESTING
Information Patent Application
On-Die Logic Analyzer For Semiconductor Die
- Publication number 20110041017
- Publication date Feb 17, 2011
- Tina C. Zhong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for providing full accessibility to instructio...
- Publication number 20040225841
- Publication date Nov 11, 2004
- Chandrashekhar S. Patwardhan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PROVIDING TEST MODE ACCESS TO AN INSTRUCTI...
- Publication number 20030061545
- Publication date Mar 27, 2003
- CHANDRASHEKHAR S. PATWARDHAN
- G06 - COMPUTING CALCULATING COUNTING

Kenneth P. Griesser

Person

Patents Grantslast 30 patents

On-die logic analyzer for semiconductor die

On-die logic analyzer for semiconductor die

On-die logic analyzer for semiconductor die

On-die logic analyzer for semiconductor die

Method and apparatus for providing full accessibility to instructio...

Method and apparatus for providing test mode access to an instructi...

Method and apparatus for providing an optimized compare-and-branch...

Method and apparatus for providing an optimized compare-and-branch...

Patents Applicationslast 30 patents

ON-DIE LOGIC ANALYZER FOR SEMICONDUCTOR DIE

On-Die Logic Analyzer For Semiconductor Die

On-Die Logic Analyzer For Semiconductor Die

On-Die Logic Analyzer For Semiconductor Die

Method and apparatus for providing full accessibility to instructio...

METHOD AND APPARATUS FOR PROVIDING TEST MODE ACCESS TO AN INSTRUCTI...