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Kenneth P. Tumin
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Design-for-test circuit for low pin count devices
Patent number
7,274,203
Issue date
Sep 25, 2007
FREESCALE SEMICONDUCTOR, INC.
Kenneth P. Tumin
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing test patterns for testing an integrated circuit
Patent number
7,047,174
Issue date
May 16, 2006
FREESCALE SEMICONDUCTOR, INC.
Alex S. Y. Koh
G01 - MEASURING TESTING
Information
Patent Grant
Methods of simulating an electronic circuit design
Patent number
6,021,271
Issue date
Feb 1, 2000
Motorola, Inc.
Marlan L. Winter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of forming an integrated circuit
Patent number
5,805,862
Issue date
Sep 8, 1998
Motorola, Inc.
Marlan L. Winter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods of simulating an electronic circuit design and forming an i...
Patent number
5,781,760
Issue date
Jul 14, 1998
Motorola, Inc.
Marlan L. Winter
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Design-for-test circuit for low pin count devices
Publication number
20070090848
Publication date
Apr 26, 2007
Freescale Semiconductor Inc.
Kenneth P. Tumin
G01 - MEASURING TESTING
Information
Patent Application
Method for producing test patterns for testing an integrated circuit
Publication number
20020163351
Publication date
Nov 7, 2002
Alex S.Y. Koh
G01 - MEASURING TESTING