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Kenneth R. Lee
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Lincoln, MA, US
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last 30 patents
Information
Patent Grant
Contactor for testing integrated circuit chips mounted in molded ca...
Patent number
5,177,436
Issue date
Jan 5, 1993
Aseco Corporation
Kenneth R. Lee
G01 - MEASURING TESTING
Information
Patent Grant
Contact set for test apparatus for testing integrated circuit package
Patent number
4,686,468
Issue date
Aug 11, 1987
Aseco Corporation
Kenneth R. Lee
G01 - MEASURING TESTING
Information
Patent Grant
Momentum arresting device for an integrated circuit tester
Patent number
4,641,738
Issue date
Feb 10, 1987
Daymarc Corporation
Nicholas J. Cedrone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic feed apparatus and process for integrated circuits stored...
Patent number
4,618,305
Issue date
Oct 21, 1986
Daymarc Corporation
Nicholas J. Cedrone
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Storage unit for an integrated circuit tester
Patent number
4,546,404
Issue date
Oct 8, 1985
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Symmetrical, single point drive for contacts of an integrated circu...
Patent number
4,534,605
Issue date
Aug 13, 1985
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Interface assembly for testing integrated circuit devices
Patent number
4,473,798
Issue date
Sep 25, 1984
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Broad band contactor assembly for testing integrated circuit devices
Patent number
4,419,626
Issue date
Dec 6, 1983
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING