Kenneth R. Wilsher

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for probing integrated circuits using polariza...
- Patent number 7,659,981
- Issue date Feb 9, 2010
- DCG Systems, Inc.
- William Lo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for probing integrated circuits using laser il...
- Patent number 7,616,312
- Issue date Nov 10, 2009
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring high-bandwidth electrical signal...
- Patent number 7,450,245
- Issue date Nov 11, 2008
- DCG Systems, Inc.
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Grant
PICA system timing measurement and calibration
- Patent number 7,228,464
- Issue date Jun 5, 2007
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting single photon detector
- Patent number 7,049,593
- Issue date May 23, 2006
- Credence Systems Corporation
- Roman Sobolewski
- G01 - MEASURING TESTING
Information Patent Grant
Optical coupling for testing integrated circuits
- Patent number 7,042,563
- Issue date May 9, 2006
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Optical coupling for testing integrated circuits
- Patent number 6,985,219
- Issue date Jan 10, 2006
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Spatial and temporal selective laser assisted fault localization
- Patent number 6,967,491
- Issue date Nov 22, 2005
- Credence Systems Corporation
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Grant
Precise, in-situ endpoint detection for charged particle beam proce...
- Patent number 6,905,623
- Issue date Jun 14, 2005
- Credence Systems Corporation
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
PICA system timing measurement & calibration
- Patent number 6,819,117
- Issue date Nov 16, 2004
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting single photon detector
- Patent number 6,812,464
- Issue date Nov 2, 2004
- Credence Systems Corporation
- Roman Sobolewski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accessing internal nodes of an integrated...
- Patent number 6,781,218
- Issue date Aug 24, 2004
- NPTest, Inc.
- Kenneth Wilsher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoconductive-sampling voltage measurement
- Patent number 6,737,853
- Issue date May 18, 2004
- NPTest, LLC
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
On-chip optically triggered latch for IC time measurements
- Patent number 6,501,288
- Issue date Dec 31, 2002
- Schlumberger Technologies, Inc.
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Double-pulsed optical interferometer for waveform probing of integr...
- Patent number 6,496,261
- Issue date Dec 17, 2002
- Schlumberger Technologies, Inc.
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Dual-laser voltage probing of IC's
- Patent number 5,905,577
- Issue date May 18, 1999
- Schlumberger Technologies, Inc.
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for controlling voltage reflections on transmiss...
- Patent number 5,287,022
- Issue date Feb 15, 1994
- Schlumberger Technologies
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed laser photoemission electron-beam probe
- Patent number 5,270,643
- Issue date Dec 14, 1993
- Schlumberger Technologies
- Neil Richardson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070046947
- Publication date Mar 1, 2007
- Credence Systems Corporation
- William Lo
- G01 - MEASURING TESTING
Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070002329
- Publication date Jan 4, 2007
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring high-bandwidth electrical signal...
- Publication number 20070002328
- Publication date Jan 4, 2007
- Credence Systems Corporation
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Application
PICA system timing measurement and calibration
- Publication number 20050160331
- Publication date Jul 21, 2005
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Optical coupling for testing integrated circuits
- Publication number 20050128471
- Publication date Jun 16, 2005
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Precise, in-situ endpoint detection for charged particle beam proce...
- Publication number 20050109956
- Publication date May 26, 2005
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Superconducting single photon detector
- Publication number 20050051726
- Publication date Mar 10, 2005
- Credence Systems Corporation
- Roman Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
Spatial and temporal selective laser assisted fault localization
- Publication number 20050006602
- Publication date Jan 13, 2005
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ACCESSING INTERNAL NODES OF AN INTEGRATED...
- Publication number 20040173878
- Publication date Sep 9, 2004
- Kenneth Wilsher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PICA system timing measurement & calibration
- Publication number 20030141879
- Publication date Jul 31, 2003
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Precise, in-situ endpoint detection for charged particle beam proce...
- Publication number 20030132196
- Publication date Jul 17, 2003
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photoconductive-sampling voltage measurement
- Publication number 20030076122
- Publication date Apr 24, 2003
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Optical coupling for testing integrated circuits
- Publication number 20020113958
- Publication date Aug 22, 2002
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Precise, in-situ endpoint detection for charged particle beam proce...
- Publication number 20020074494
- Publication date Jun 20, 2002
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS

Kenneth R. Wilsher

Person

Patents Grantslast 30 patents

Apparatus and method for probing integrated circuits using polariza...

Apparatus and method for probing integrated circuits using laser il...

Method and apparatus for measuring high-bandwidth electrical signal...

PICA system timing measurement and calibration

Superconducting single photon detector

Optical coupling for testing integrated circuits

Optical coupling for testing integrated circuits

Spatial and temporal selective laser assisted fault localization

Precise, in-situ endpoint detection for charged particle beam proce...

PICA system timing measurement &#x00026; calibration

Superconducting single photon detector

Method and apparatus for accessing internal nodes of an integrated...

Photoconductive-sampling voltage measurement

On-chip optically triggered latch for IC time measurements

Double-pulsed optical interferometer for waveform probing of integr...

Dual-laser voltage probing of IC's

Method and circuit for controlling voltage reflections on transmiss...

Pulsed laser photoemission electron-beam probe

Patents Applicationslast 30 patents

Laser probing system for integrated circuits

Laser probing system for integrated circuits

Method and apparatus for measuring high-bandwidth electrical signal...

PICA system timing measurement and calibration

Optical coupling for testing integrated circuits

Precise, in-situ endpoint detection for charged particle beam proce...

Superconducting single photon detector

Spatial and temporal selective laser assisted fault localization

METHOD AND APPARATUS FOR ACCESSING INTERNAL NODES OF AN INTEGRATED...

PICA system timing measurement & calibration

Precise, in-situ endpoint detection for charged particle beam proce...

Photoconductive-sampling voltage measurement

Optical coupling for testing integrated circuits

Precise, in-situ endpoint detection for charged particle beam proce...

PICA system timing measurement & calibration