Kenneth W. Marr

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of forming circuit-protection devices
- Patent number 12,015,026
- Issue date Jun 18, 2024
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for on-chip stress detection
- Patent number 11,978,680
- Issue date May 7, 2024
- Micron Technology, Inc.
- Kenneth William Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory system failure detection and self recovery of memory dice
- Patent number 11,966,303
- Issue date Apr 23, 2024
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device protection circuits, and associated methods, d...
- Patent number 11,823,731
- Issue date Nov 21, 2023
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Active protection circuits for semiconductor devices
- Patent number 11,676,917
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device including circuitry under bond pads
- Patent number 11,424,169
- Issue date Aug 23, 2022
- Micron Technology, Inc.
- Chiara Cerafogli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for on-chip stress detection
- Patent number 11,189,536
- Issue date Nov 30, 2021
- Micron Technology, Inc.
- Kenneth William Marr
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device protection circuits for protecting a semicondu...
- Patent number 11,158,367
- Issue date Oct 26, 2021
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit-protection devices
- Patent number 11,139,289
- Issue date Oct 5, 2021
- Micron Technology, Inc.
- Michael A. Smith
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,665,307
- Issue date May 26, 2020
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of forming circuit-protection devices
- Patent number 10,580,766
- Issue date Mar 3, 2020
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming circuit-protection devices
- Patent number 10,431,577
- Issue date Oct 1, 2019
- Micron Technology, Inc.
- Michael A. Smith
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,366,767
- Issue date Jul 30, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Grant
Program operations with embedded leak checks
- Patent number 9,761,322
- Issue date Sep 12, 2017
- Micron Technology, Inc.
- Jeffery A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for die seal crack detection
- Patent number 9,557,376
- Issue date Jan 31, 2017
- Micron Technology, Inc.
- Charles H. Dennison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses and methods for die seal crack detection
- Patent number 9,287,184
- Issue date Mar 15, 2016
- Micron Technology, Inc.
- Charles H. Dennison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Program operations with embedded leak checks
- Patent number 9,281,078
- Issue date Mar 8, 2016
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Depletion mode circuit protection device
- Patent number 8,243,526
- Issue date Aug 14, 2012
- Intel Corporation
- Michael Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuits and methods for repairing defects in memory devices
- Patent number 7,873,882
- Issue date Jan 18, 2011
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and methods for repairing defects in memory devices
- Patent number 7,836,362
- Issue date Nov 16, 2010
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and methods for repairing defects in memory devices
- Patent number 7,437,632
- Issue date Oct 14, 2008
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor fuses and semiconductor devices containing the same
- Patent number 7,425,472
- Issue date Sep 16, 2008
- Micron Technology, Inc.
- Kenneth W. Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate dielectric antifuse circuit to protect a high-voltage transistor
- Patent number 7,405,463
- Issue date Jul 29, 2008
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods, circuits, and applications using a resistor and a Schottky...
- Patent number 7,369,379
- Issue date May 6, 2008
- Micron Technology, Inc.
- Kenneth W. Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for wafer level burn-in
- Patent number 7,279,918
- Issue date Oct 9, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for determining burn-in reliability from wafer level burn-in
- Patent number 7,215,134
- Issue date May 8, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for detecting a mode of operation of an integrate...
- Patent number 7,183,792
- Issue date Feb 27, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and methods to protect a gate dielectric antifuse
- Patent number 7,126,871
- Issue date Oct 24, 2006
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods, apparatus and systems for wafer-level burn-in stressing of...
- Patent number 7,123,042
- Issue date Oct 17, 2006
- Micron Technology, Inc.
- Kenneth W. Marr
- G01 - MEASURING TESTING
Information Patent Grant
Methods for wafer level burn-in
- Patent number 7,119,568
- Issue date Oct 10, 2006
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS OF MEMORY ARRAY DEVICE WITH LOW ARCING RISK
- Publication number 20240395325
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Shyam Surthi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT DIGITAL THERMOMETER IN A MEMORY DEVICE
- Publication number 20240233839
- Publication date Jul 11, 2024
- Micron Technology, Inc.
- Chiara Cerafogli
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING TRAP-UP IN A MEMORY SYSTEM
- Publication number 20240233842
- Publication date Jul 11, 2024
- Micron Technology, Inc.
- Pitamber Shukla
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE
- Publication number 20240220375
- Publication date Jul 4, 2024
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPACT DIGITAL THERMOMETER IN A MEMORY DEVICE
- Publication number 20240136000
- Publication date Apr 25, 2024
- Micron Technology, Inc.
- Chiara Cerafogli
- G11 - INFORMATION STORAGE
Information Patent Application
DISCHARGE CIRCUITS
- Publication number 20240071516
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE
- Publication number 20230393955
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE PROTECTION CIRCUITS FOR SEMICONDUCTOR DEVICES
- Publication number 20230275042
- Publication date Aug 31, 2023
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WELL RING FOR RESISTIVE GROUND POWER DOMAIN SEGREGATION
- Publication number 20230017305
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Mattia Cichocki
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING CIRCUITRY UNDER BOND PADS
- Publication number 20230005799
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Chiara Cerafogli
- G11 - INFORMATION STORAGE
Information Patent Application
ACTIVE PROTECTION CIRCUITS FOR SEMICONDUCTOR DEVICES
- Publication number 20220165688
- Publication date May 26, 2022
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION
- Publication number 20220084896
- Publication date Mar 17, 2022
- Micron Technology, Inc.
- Kenneth William Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE PROTECTION CIRCUITS, AND ASSOCIATED METHODS, D...
- Publication number 20220013160
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS OF FORMING CIRCUIT-PROTECTION DEVICES
- Publication number 20210407989
- Publication date Dec 30, 2021
- Micron Technology, Inc.
- Michael A. Smith
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE PROTECTION CIRCUITS FOR PROTECTING A SEMICONDU...
- Publication number 20210319827
- Publication date Oct 14, 2021
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING CIRCUITRY UNDER BOND PADS
- Publication number 20210043525
- Publication date Feb 11, 2021
- Micron Technology, Inc.
- Chiara Cerafogli
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION
- Publication number 20200211914
- Publication date Jul 2, 2020
- Micron Technology, Inc.
- Kenneth William Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT-PROTECTION DEVICES
- Publication number 20190371790
- Publication date Dec 5, 2019
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING CIRCUIT-PROTECTION DEVICES
- Publication number 20190371789
- Publication date Dec 5, 2019
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20190287634
- Publication date Sep 19, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT-PROTECTION DEVICES
- Publication number 20190206856
- Publication date Jul 4, 2019
- Micron Technology, Inc.
- Michael A. Smith
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20170352431
- Publication date Dec 7, 2017
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR DIE SEAL CRACK DETECTION
- Publication number 20160195581
- Publication date Jul 7, 2016
- Micron Technology, Inc.
- Charles H. Dennison
- G01 - MEASURING TESTING
Information Patent Application
PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS
- Publication number 20160155513
- Publication date Jun 2, 2016
- Micron Technology, Inc.
- Jeffery A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS
- Publication number 20150364213
- Publication date Dec 17, 2015
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR DIE SEAL CRACK DETECTION
- Publication number 20150170979
- Publication date Jun 18, 2015
- Micron Technology, Inc.
- Charles H. Dennison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Depletion mode circuit protection device
- Publication number 20110140227
- Publication date Jun 16, 2011
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor fuses and methods for fabricating and programming the...
- Publication number 20070190751
- Publication date Aug 16, 2007
- Kenneth W. Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for detecting a mode of operation of an integrate...
- Publication number 20070182603
- Publication date Aug 9, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G01 - MEASURING TESTING
Information Patent Application
Circuits and methods for repairing defects in memory devices
- Publication number 20070168771
- Publication date Jul 19, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE

Kenneth W. Marr

Person

Patents Grantslast 30 patents

Methods of forming circuit-protection devices

Method and apparatus for on-chip stress detection

Memory system failure detection and self recovery of memory dice

Semiconductor device protection circuits, and associated methods, d...

Active protection circuits for semiconductor devices

Memory device including circuitry under bond pads

Method and apparatus for on-chip stress detection

Semiconductor device protection circuits for protecting a semicondu...

Circuit-protection devices

Memory devices configured to perform leak checks

Methods of forming circuit-protection devices

Methods of forming circuit-protection devices

Memory devices configured to perform leak checks

Program operations with embedded leak checks

Apparatuses and methods for die seal crack detection

Apparatuses and methods for die seal crack detection

Program operations with embedded leak checks

Depletion mode circuit protection device

Circuits and methods for repairing defects in memory devices

Circuits and methods for repairing defects in memory devices

Circuits and methods for repairing defects in memory devices

Semiconductor fuses and semiconductor devices containing the same

Gate dielectric antifuse circuit to protect a high-voltage transistor

Methods, circuits, and applications using a resistor and a Schottky...

Methods for wafer level burn-in

Apparatus for determining burn-in reliability from wafer level burn-in

Method and system for detecting a mode of operation of an integrate...

Circuits and methods to protect a gate dielectric antifuse

Methods, apparatus and systems for wafer-level burn-in stressing of...

Methods for wafer level burn-in

Patents Applicationslast 30 patents

METHOD AND APPARATUS OF MEMORY ARRAY DEVICE WITH LOW ARCING RISK

COMPACT DIGITAL THERMOMETER IN A MEMORY DEVICE

MANAGING TRAP-UP IN A MEMORY SYSTEM

MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE

COMPACT DIGITAL THERMOMETER IN A MEMORY DEVICE

DISCHARGE CIRCUITS

MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE

ACTIVE PROTECTION CIRCUITS FOR SEMICONDUCTOR DEVICES

WELL RING FOR RESISTIVE GROUND POWER DOMAIN SEGREGATION

MEMORY DEVICE INCLUDING CIRCUITRY UNDER BOND PADS

ACTIVE PROTECTION CIRCUITS FOR SEMICONDUCTOR DEVICES

METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION

SEMICONDUCTOR DEVICE PROTECTION CIRCUITS, AND ASSOCIATED METHODS, D...

METHODS OF FORMING CIRCUIT-PROTECTION DEVICES

SEMICONDUCTOR DEVICE PROTECTION CIRCUITS FOR PROTECTING A SEMICONDU...

MEMORY DEVICE INCLUDING CIRCUITRY UNDER BOND PADS

METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION

CIRCUIT-PROTECTION DEVICES

METHODS OF FORMING CIRCUIT-PROTECTION DEVICES

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

CIRCUIT-PROTECTION DEVICES

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

APPARATUSES AND METHODS FOR DIE SEAL CRACK DETECTION

PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS

PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS

APPARATUSES AND METHODS FOR DIE SEAL CRACK DETECTION

Depletion mode circuit protection device

Semiconductor fuses and methods for fabricating and programming the...

Method and system for detecting a mode of operation of an integrate...

Circuits and methods for repairing defects in memory devices