Kenneth W. Nill

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Lexington, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
CD-GISAXS system and method
- Patent number 7,920,676
- Issue date Apr 5, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Element-specific X-ray fluorescence microscope and method of operation
- Patent number 7,245,696
- Issue date Jul 17, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Element-specific X-ray fluorescence microscope and method of operation
- Patent number 7,183,547
- Issue date Feb 27, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Achromatic fresnel optics based lithography for short wavelength el...
- Patent number 6,885,503
- Issue date Apr 26, 2005
- Xradia, Inc.
- Wenbing Yun
- G02 - OPTICS
Information Patent Grant
Scanning laser spectrometer
- Patent number 4,410,273
- Issue date Oct 18, 1983
- Laser Analytics, Inc.
- Arlan W. Mantz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CD-GISAXS System and Method
- Publication number 20080273662
- Publication date Nov 6, 2008
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Back-end-of-line metallization inspection and metrology microscopy...
- Publication number 20050282300
- Publication date Dec 22, 2005
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Element-specific X-ray fluorescence microscope and method of operation
- Publication number 20050109936
- Publication date May 26, 2005
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Achromatic fresnel optics based lithography for short wavelength el...
- Publication number 20040085641
- Publication date May 6, 2004
- XRADIA, INC.
- Wenbing Yun
- G02 - OPTICS
Information Patent Application
Element-specific X-ray fluorescence microscope and method of operation
- Publication number 20030223536
- Publication date Dec 4, 2003
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING