Kenong Wu

Person

Davis, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Print check repeater defect detection
- Patent number 12,190,498
- Issue date Jan 7, 2025
- KLA Corp.
- Nurmohammed Patwary
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Print check repeater defect detection
- Patent number 11,328,411
- Issue date May 10, 2022
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and non-transitory computer readable medium for tuni...
- Patent number 11,139,216
- Issue date Oct 5, 2021
- KLA-Tencor Corporation
- David Craig Oram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High accuracy of relative defect locations for repeater analysis
- Patent number 11,067,516
- Issue date Jul 20, 2021
- KLA-Tencor Corp.
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects in a logic region on a wafer
- Patent number 10,923,317
- Issue date Feb 16, 2021
- KLA Corp.
- Junqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and non-transitory computer readable medium for tuni...
- Patent number 10,679,909
- Issue date Jun 9, 2020
- KLA-Tencor Corporation
- David Craig Oram
- G01 - MEASURING TESTING
Information Patent Grant
System and method for aligning semiconductor device reference image...
- Patent number 10,572,991
- Issue date Feb 25, 2020
- KLA-Tencor Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive local threshold and color filtering
- Patent number 10,395,359
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods to store dynamic layer content inside a design file
- Patent number 10,387,601
- Issue date Aug 20, 2019
- KLA-Tencor Corporation
- Thirupurasundari Jayaraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy of relative defect locations for repeater analysis
- Patent number 10,365,232
- Issue date Jul 30, 2019
- KLA-Tencor Corp.
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defining care areas in repeating structures o...
- Patent number 10,339,262
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection and classification based on attributes determined...
- Patent number 10,127,652
- Issue date Nov 13, 2018
- KLA-Tencor Corp.
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer using defect-specific and multi-channe...
- Patent number 9,846,930
- Issue date Dec 19, 2017
- KLA-Tencor Corp.
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Array mode repeater detection
- Patent number 9,766,186
- Issue date Sep 19, 2017
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Repeater detection
- Patent number 9,766,187
- Issue date Sep 19, 2017
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection using structural information
- Patent number 9,727,047
- Issue date Aug 8, 2017
- KLA-Tencor Corp.
- Qing Luo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Detecting defects on a wafer using defect-specific information
- Patent number 9,721,337
- Issue date Aug 1, 2017
- KLA-Tencor Corp.
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive local threshold and color filtering
- Patent number 9,704,234
- Issue date Jul 11, 2017
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting one or more parameters for inspection of a wafer
- Patent number 9,601,393
- Issue date Mar 21, 2017
- KLA-Tencor Corp.
- Chris Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting defects on a wafer using defect-specific and multi-channe...
- Patent number 9,552,636
- Issue date Jan 24, 2017
- KLA-Tencor Corp.
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer defect discovery
- Patent number 9,518,934
- Issue date Dec 13, 2016
- KLA-Tencor Corp.
- Hong Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Data perturbation for wafer inspection or metrology setup using a m...
- Patent number 9,360,863
- Issue date Jun 7, 2016
- KLA-Tencor Corp.
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Grant
Selecting parameters for defect detection methods
- Patent number 9,310,316
- Issue date Apr 12, 2016
- KLA-Tencor Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects on a wafer using defect-specific information
- Patent number 9,189,844
- Issue date Nov 17, 2015
- KLA-Tencor Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection using free-form care areas
- Patent number 9,171,364
- Issue date Oct 27, 2015
- KLA-Tencor Corp.
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer using defect-specific and multi-channe...
- Patent number 9,092,846
- Issue date Jul 28, 2015
- KLA-Tencor Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Region based virtual fourier filter
- Patent number 8,989,479
- Issue date Mar 24, 2015
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 8,111,900
- Issue date Feb 7, 2012
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 7,729,529
- Issue date Jun 1, 2010
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for binning defects detected on a specimen
- Patent number 7,570,800
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20240177294
- Publication date May 30, 2024
- KLA Corporation
- Nurmohammed Patwary
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20210342992
- Publication date Nov 4, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...
- Publication number 20200258792
- Publication date Aug 13, 2020
- KLA-Tencor Corporation
- David Craig Oram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING DEFECTS IN A LOGIC REGION ON A WAFER
- Publication number 20200090904
- Publication date Mar 19, 2020
- KLA Corporation
- Junqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS
- Publication number 20200072763
- Publication date Mar 5, 2020
- KLA-Tencor Corporation
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Aligning Semiconductor Device Reference Image...
- Publication number 20190139208
- Publication date May 9, 2019
- KLA-Tencor Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS
- Publication number 20180328860
- Publication date Nov 15, 2018
- KLA-Tencor Corporation
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...
- Publication number 20180144996
- Publication date May 24, 2018
- KLA-Tencor Corporation
- David Craig Oram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Defining Care Areas in Repeating Structures o...
- Publication number 20170286589
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Local Threshold and Color Filtering
- Publication number 20170287128
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods to Store Dynamic Layer Content Inside a Design File
- Publication number 20170154147
- Publication date Jun 1, 2017
- KLA-Tencor Corporation
- Thirupurasundari Jayaraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channe...
- Publication number 20170091925
- Publication date Mar 30, 2017
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
Wafer Defect Discovery
- Publication number 20170076911
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- Hong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Defect Discovery
- Publication number 20160123898
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
Defect Detection Using Structural Information
- Publication number 20160104600
- Publication date Apr 14, 2016
- KLA-Tencor Corporation
- Qing Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific Information
- Publication number 20160071256
- Publication date Mar 10, 2016
- KLA-Tencor Corporation
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Repeater Detection
- Publication number 20160061745
- Publication date Mar 3, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
Array Mode Repeater Detection
- Publication number 20160061749
- Publication date Mar 3, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channe...
- Publication number 20160027165
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION AND CLASSIFICATION BASED ON ATTRIBUTES DETERMINED...
- Publication number 20150221076
- Publication date Aug 6, 2015
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Local Threshold and Color Filtering
- Publication number 20150043804
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Inspection Using Free-Form Care Areas
- Publication number 20140376802
- Publication date Dec 25, 2014
- KLA-Tencor Corporation
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channe...
- Publication number 20140219544
- Publication date Aug 7, 2014
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific Information
- Publication number 20140105482
- Publication date Apr 17, 2014
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
Selecting Parameters for Defect Detection Methods
- Publication number 20140072203
- Publication date Mar 13, 2014
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
REGION BASED VIRTUAL FOURIER FILTER
- Publication number 20120141013
- Publication date Jun 7, 2012
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Perturbation for Wafer Inspection or Metrology Setup
- Publication number 20120116733
- Publication date May 10, 2012
- KLA-Tencor Corporation
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Application
Selecting One or More Parameters for Inspection of a Wafer
- Publication number 20110320149
- Publication date Dec 29, 2011
- KLA-Tencor Corporation
- Chris Lee
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS FOR DETECTING AND/OR SORTING DEFECTS I...
- Publication number 20100226562
- Publication date Sep 9, 2010
- KLA-Tencor Technologies Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN
- Publication number 20090290784
- Publication date Nov 26, 2009
- KLA-Tencor Technologies Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Print check repeater defect detection

Print check repeater defect detection

System, method and non-transitory computer readable medium for tuni...

High accuracy of relative defect locations for repeater analysis

Detecting defects in a logic region on a wafer

System, method and non-transitory computer readable medium for tuni...

System and method for aligning semiconductor device reference image...

Adaptive local threshold and color filtering

Methods to store dynamic layer content inside a design file

High accuracy of relative defect locations for repeater analysis

System and method for defining care areas in repeating structures o...

Defect detection and classification based on attributes determined...

Detecting defects on a wafer using defect-specific and multi-channe...

Array mode repeater detection

Repeater detection

Defect detection using structural information

Detecting defects on a wafer using defect-specific information

Adaptive local threshold and color filtering

Selecting one or more parameters for inspection of a wafer

Detecting defects on a wafer using defect-specific and multi-channe...

Wafer defect discovery

Data perturbation for wafer inspection or metrology setup using a m...

Selecting parameters for defect detection methods

Detecting defects on a wafer using defect-specific information

Wafer inspection using free-form care areas

Detecting defects on a wafer using defect-specific and multi-channe...

Region based virtual fourier filter

Computer-implemented methods for detecting and/or sorting defects i...

Computer-implemented methods for detecting and/or sorting defects i...

Methods and systems for binning defects detected on a specimen

Patents Applicationslast 30 patents

PRINT CHECK REPEATER DEFECT DETECTION

PRINT CHECK REPEATER DEFECT DETECTION

SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...

DETECTING DEFECTS IN A LOGIC REGION ON A WAFER

HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS

System and Method for Aligning Semiconductor Device Reference Image...

HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS

SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...

System and Method for Defining Care Areas in Repeating Structures o...

Adaptive Local Threshold and Color Filtering

Methods to Store Dynamic Layer Content Inside a Design File

Detecting Defects on a Wafer Using Defect-Specific and Multi-Channe...

Wafer Defect Discovery

Wafer Defect Discovery

Defect Detection Using Structural Information

Detecting Defects on a Wafer Using Defect-Specific Information

Repeater Detection

Array Mode Repeater Detection

Detecting Defects on a Wafer Using Defect-Specific and Multi-Channe...

DEFECT DETECTION AND CLASSIFICATION BASED ON ATTRIBUTES DETERMINED...

Adaptive Local Threshold and Color Filtering

Wafer Inspection Using Free-Form Care Areas

Detecting Defects on a Wafer Using Defect-Specific and Multi-Channe...

Detecting Defects on a Wafer Using Defect-Specific Information

Selecting Parameters for Defect Detection Methods

REGION BASED VIRTUAL FOURIER FILTER

Data Perturbation for Wafer Inspection or Metrology Setup

Selecting One or More Parameters for Inspection of a Wafer

COMPUTER-IMPLEMENTED METHODS FOR DETECTING AND/OR SORTING DEFECTS I...

METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN